|
|
-
Reliability/Lifetime/Burn-In
-
Documents
- White paper
-
- Focus Solutions
-
Accelerated Stress Testing (AST) - Source power, monitor temperature, measure multiple DUTs
-
Lifetime - Temperature and humidity measurement, distributed/remote communication, long life
-
Quality Assurance Testing (QAT)
-
Process Monitoring (TEG)
-
Products
-
Documents
- White paper
-
- Focus Solutions
-
End-of-line LTPS TFT/Driver acceptance - Transistors (Vt), diodes, capacitors, resistors, gate delay
-
Gate/poly - MOSCAP GOI, ECD, Vt
-
New Technologies - Low Temperature Poly-Silicon AM- LCD/OLED (TEG)
-
Materials Research
-
Documents
- White paper
-
- Focus Solutions
-
Organic Materials - Leakage current, reverse breakdown voltage, charge characterization
-
Semiconductors - Resistivity measurements
-
Semiconductors - Stress test for reliability
-
Silicon Semiconductors - Gate Capacitance (charge storage)
-
Functional Test
-
Documents
- White paper
-
- Focus Solutions
-
LCD and Passive OLED Driver IC Test - Source V, measure I; Source I, measure V
-
OLED Active Matrix TFT and Pixel Array Test - LTPS Driver IC IDDQ Current Testing
-
OLED Passive Matrix Array Test - Row/Column shorts and opens, ITO resistivity
-
Device Characterization
- Focus Solutions
-
Amorphous, LTPS Thin Film Transistors - I-V, C-V measurements
-
OLED Materials Research - Wide dynamic range, high testing accuracy, fast measurements
-
Storage element capacitance, FET gate charge,gate leakage current, TFT breakdown voltage
|
