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Silicon Semiconductors - Gate Capacitance (charge storage)
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Products
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System 82-WIN Simultaneous C-V System for Windows
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Semiconductors - Stress test for reliability
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Products
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Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
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Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
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Model 707A 6-Slot, Switching Matrix w/ up to 576 Ch
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Model 7174A 8x12, Low-Current, High-Speed Matrix Card (for Models 707A and 708A)
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Semiconductors - Resistivity measurements
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Products
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Model 2010 7-1/2-Digit, Low-Noise, Autoranging DMM
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Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
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Model 6517A Electrometer/High-Resistance Meter
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Organic Materials - Leakage current, reverse breakdown voltage, charge characterization
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Products
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Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
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Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output
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Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
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Model 6430 Sub-Femtoamp Remote SourceMeter
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Model 6485 5-1/2 digit Picoammeter with 10fA Resolution
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Model 6517A Electrometer/High-Resistance Meter
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