Keithley Instruments Inc.

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Semiconductor Device Characterization
Precision Temperature Control
Pacemakers
Laser
Infrared LEDs
Implantable Electrical Devices
Defibrillators
Burn-in, Accelerated Stress Test

Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond

Model 707A 6-Slot, Switching Matrix w/ up to 576 Ch

Documents

Application note

#2241 Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS

Article

Integral PC Design of Keithley Model 4200-SCS is at the Leading Edge of a New Instrumentation Trend

Model 2510 TEC SourceMeter

Model 2510-AT Autotuning TEC SourceMeter

Documents

Application note

Optimizing TEC PID Coefficients Automatically with the Model 2510-AT

Model 237 High-Voltage Source-Measure Unit

Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output

Model 707A 6-Slot, Switching Matrix w/ up to 576 Ch

Documents

Article

Source-Measure Units Increase Productivity and Accuracy

Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output

Model 2425 100W SourceMeter w/ Measurements up to 100V and 3A

Model 2430 1kW Pulse Mode SourceMeter w/ Measurements up to 100V and 10A

Model 2440 5A SourceMeter w/ Measurements up to 40V and 5A, 50W Power Output

Model 2500INT-2-IGAC Integrating Sphere w/Cooled Indium Gallium Arsenide Detector, 2-inch

Model 2502 Fiber Alignment Photodiode Meter

Model 2510 TEC SourceMeter

Model 2510-AT Autotuning TEC SourceMeter

Model 2520 Pulsed Laser Diode Test System w/ Remote Test Head

System 25 Laser Diode LIV Test System Kit

Documents

Application note

#2214 High-Throughput DC Production Test of Telecommunications Laser Diode Modules

#2273 VCSEL Testing with the Model 2400 SourceMeter Instrument

#2301 Measuring Laser Diode Optical Power with the Keithley Model 2500INT Integrating Sphere

Making Pulsed Light Measurements with the Model 2520INT Integrating Sphere

Article

Pulse Testing Of Laser Diodes

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output

Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output

Model 2425 100W SourceMeter w/ Measurements up to 100V and 3A

Model 2430 1kW Pulse Mode SourceMeter w/ Measurements up to 100V and 10A

Model 2440 5A SourceMeter w/ Measurements up to 40V and 5A, 50W Power Output

Model 2500INT-2-IGAC Integrating Sphere w/Cooled Indium Gallium Arsenide Detector, 2-inch

Model 2502 Fiber Alignment Photodiode Meter

Model 2510 TEC SourceMeter

Model 2510-AT Autotuning TEC SourceMeter

Model 2520 Pulsed Laser Diode Test System w/ Remote Test Head

Model 6485 5-1/2 digit Picoammeter with 10fA Resolution

Model 6487 Picoammeter/Voltage Source

Documents

Application note

#2218 Production Testing of High-Intensity, Visible LEDs

Model 237 High-Voltage Source-Measure Unit

Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output

Model 2700 DMM, Data Acquisition, Datalogging System w/ 2 Slots

Model 707A 6-Slot, Switching Matrix w/ up to 576 Ch

Model 237 High-Voltage Source-Measure Unit

Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output

Model 707A 6-Slot, Switching Matrix w/ up to 576 Ch

Documents

Article

Source-Measure Units Increase Productivity and Accuracy

Model 2701 DMM, Data Acquisition, Datalogging System w/2 Slots and Ethernet Support

Model 7708 40-Ch, Diff Mux Module w/ Automatic CJC and Screw Terminals (for Models 2700, 2701, and 2750)

Documents

Application note

#2260 Burn-in Testing Techniques for Switching Power Supplies

Network Primer/Programming Tutorial for the Model 2701 Ethernet-Based DMM/Data Acquisition System

White paper

Fundamentals of HALT/HASS Testing

Instrument-Grade Data Acquisition with Ethernet Brings Precision Measurement and Control to Networks

Making AST/Burn-in Testing More Productive with Ethernet-based Instruments

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