Keithley Instruments Inc. - Focus Solutions

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Nanoelectronic Devices - Cv Characterization
Nanoelectronic Devices - High Resistance Measurements
Nanoelectronic Devices - Low Resistance Measurements
Nanoelectronic Devices - Nanoelectronic, Set, and Molecular Electronic I-V Curves
Nanomaterials Characterization - High Resistance Measurements
Nanomaterials Characterization - Low Resistance Measurements

Nanoelectronic Devices - Cv Characterization
Products

Documents

Application note

#315 Capacitor Leakage Measurements Using a Model 6517A Electrometer

Nanoelectronic Devices - High Resistance Measurements
Products

Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond

Model 6430 Sub-Femtoamp Remote SourceMeter

Model 6487 Picoammeter/Voltage Source

Model 6517A Electrometer/High-Resistance Meter

Documents

Application note

#100 Low Current Measurements

#2241 Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS

#312 High Resistance Measurements Application Note

#314 Volume and Surface Resistivity Application Note

Article

Integral PC Design of Keithley Model 4200-SCS is at the Leading Edge of a New Instrumentation Trend

Nanoelectronic Devices - Low Resistance Measurements
Products

Model 2001 High-Performance, 7-1/2-Digit DMM w/ 8k Memory

Model 2002 High-Performance, 8-1/2-Digit DMM w/ 8k Memory

Model 2010 7-1/2-Digit, Low-Noise, Autoranging DMM

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Documents

Application note

no doc 3597

Nanoelectronic Devices - Nanoelectronic, Set, and Molecular Electronic I-V Curves
Products

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond

Model 6430 Sub-Femtoamp Remote SourceMeter

Model 6517A Electrometer/High-Resistance Meter

Documents

Application note

#100 Low Current Measurements

no doc 3597

#2241 Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS

Device Characterization Techniques Using Keithley SourceMeter Instruments with LabTracer Software

#312 High Resistance Measurements Application Note

#314 Volume and Surface Resistivity Application Note

Article

Instrument Techniques that Reduce Effects of External Error Sources

Nanomaterials Characterization - High Resistance Measurements
Products

Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond

Model 6430 Sub-Femtoamp Remote SourceMeter

Model 6487 Picoammeter/Voltage Source

Model 6517A Electrometer/High-Resistance Meter

Model 8009 Resistivity Test Chamber (for Models 6517A, 6517B)

Documents

Application note

#100 Low Current Measurements

#2241 Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS

#312 High Resistance Measurements Application Note

#314 Volume and Surface Resistivity Application Note

Article

Integral PC Design of Keithley Model 4200-SCS is at the Leading Edge of a New Instrumentation Trend

Nanomaterials Characterization - Low Resistance Measurements
Products

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond

Model 6430 Sub-Femtoamp Remote SourceMeter

Documents

Application note

no doc 3597

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