Nanoelectronic Devices - Nanoelectronic, Set, and Molecular Electronic I-V Curves
Document Actions
- Products
- Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
- Model 4200-SCS Semiconductor Characterization System
- Model 6430 Sub-Femtoamp Remote SourceMeter
- Documents
- Application note
- #100 Low Current Measurements
- no doc 3597
- #2241 Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS
- Device Characterization Techniques Using Keithley SourceMeter Instruments with LabTracer Software
- #312 High Resistance Measurements Application Note
- #314 Volume and Surface Resistivity Application Note
- Article
- Instrument Techniques that Reduce Effects of External Error Sources