Nanomaterials Characterization - High Resistance Measurements
Document Actions
- Products
- Model 4200-SCS Semiconductor Characterization System
- Model 6430 Sub-Femtoamp Remote SourceMeter
- Model 6487 Picoammeter/Voltage Source
- Model 8009 Resistivity Test Chamber (for Models 6517A, 6517B)
- Documents
- Application note
- #100 Low Current Measurements
- #2241 Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS
- #312 High Resistance Measurements Application Note
- #314 Volume and Surface Resistivity Application Note
- Article
- Integral PC Design of Keithley Model 4200-SCS is at the Leading Edge of a New Instrumentation Trend