Keithley Instruments Inc. - Focus Solutions

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Capacitors - Capacitance, Charge, Low Current, Breakdown Voltage
Device Modeling - Data Acquisition and Parameter Extraction
Diodes - High Breakdown Voltage, I-V Curves
Resistors - Wide Dynamic Range, High Testing Accuracy, Fast Measurements
Transistors - I-V, C-V Measurements

Capacitors - Capacitance, Charge, Low Current, Breakdown Voltage
Products

Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output

Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond

Model 6517A Electrometer/High-Resistance Meter

System 82-WIN Simultaneous C-V System for Windows

Documents

Application note

#2239 Gate Dielectric Capacitance-Voltage Characterization Using the Model 4200

Device Modeling - Data Acquisition and Parameter Extraction
Products

Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond

Diodes - High Breakdown Voltage, I-V Curves
Products

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output

Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output

Model 2425 100W SourceMeter w/ Measurements up to 100V and 3A

Model 2430 1kW Pulse Mode SourceMeter w/ Measurements up to 100V and 10A

Model 2440 5A SourceMeter w/ Measurements up to 40V and 5A, 50W Power Output

Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond

Model 6430 Sub-Femtoamp Remote SourceMeter

Documents

Application note

#2197 Evaluating Hot Carrier Induced Degradation of MOSFET Devices

Resistors - Wide Dynamic Range, High Testing Accuracy, Fast Measurements
Products

Model 2000 6-1/2-Digit DMM

Model 2010 7-1/2-Digit, Low-Noise, Autoranging DMM

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output

Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output

Model 2425 100W SourceMeter w/ Measurements up to 100V and 3A

Model 2430 1kW Pulse Mode SourceMeter w/ Measurements up to 100V and 10A

Model 2440 5A SourceMeter w/ Measurements up to 40V and 5A, 50W Power Output

Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond

Model 6430 Sub-Femtoamp Remote SourceMeter

Model 6517A Electrometer/High-Resistance Meter

Documents

Application note

#312 High Resistance Measurements Application Note

Transistors - I-V, C-V Measurements
Products

Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output

Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output

Model 2440 5A SourceMeter w/ Measurements up to 40V and 5A, 50W Power Output

Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond

System 82-WIN Simultaneous C-V System for Windows

Documents

Application note

#2239 Gate Dielectric Capacitance-Voltage Characterization Using the Model 4200

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