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Reliability Test Solutions
- Focus Solutions
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Accelerated Stress Testing (AST) - Source power, monitor temperature, measure multiple DUT
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Monitor and log lab environmental parameters - Temperature and humidity measurement, distributed/remote communication, long life
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Quality Assurance Testing (QAT) - Modular building blocks for custom-built solutions, drivers to support control and communication
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Wafer level hot carrier degradation - High accuracy, low noise, the ability to stress multiple transistors in parallel and measure small degradations
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Process Monitoring
- Focus Solutions
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End-of-line wafer acceptance - Transistors (Vt), diodes, capacitors, resistors, gate delay
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Equipment qualification - Defect density
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Gate/poly - MOSCAP GOI, ECD, Vt
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Metal-2 - Contact check, electromigration, EWR
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New Technologies - RF/DC, SOC, FeRAMs, MRAMS, LCD-TEGs
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Materials Research
- Focus Solutions
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Conductor/interconnect materials - Low current measurements
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Conductor/interconnect materials - Low resistance and capacitance measurements
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Dielectric Materials - Low current, breakdown voltage, charge characterization
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Insulators - High resistance measurements
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Semiconductors - Resistivity measurements
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Semiconductors - Stress test for reliability
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Superconductors - Fast, low noise measurements of low resistances
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Functional Test
- Focus Solutions
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Customized flexible low-volume functional test - Test sequence list, Fast pass/fail, binning/sorting, RF
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IDDQ (SOC and other highly integrated devices) - Source V, measure low current
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Optical ICs and transceivers - Source V, measure I; Source I, measure V
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Transistors - I-V, C-V measurements
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Device Characterization
- Focus Solutions
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Capacitors - Capacitance, charge, low current, breakdown voltage
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Device Modeling - Data Acquisition and parameter extraction
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Diodes - High breakdown voltage, I-V curves
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Nanoelectronic devices - C-V characterization
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Nanoelectronic devices - Low resistance measurements
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Nanoelectronic devices - Nanoelectronic and molecular electronic I-V curves
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Resistors - Wide dynamic range, high testing accuracy, fast measurements
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Transistors - I-V, C-V measurements
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