|
|
-
Focus Solutions
- Accelerated Stress Testing (AST) - Source power, monitor temperature, measure multiple DUT
- Monitor and log lab environmental parameters - Temperature and humidity measurement, distributed/remote communication, long life
- Quality Assurance Testing (QAT) - Modular building blocks for custom-built solutions, drivers to support control and communication
- Wafer level hot carrier degradation - High accuracy, low noise, the ability to stress multiple transistors in parallel and measure small degradations
|
