Keithley Instruments Inc. - Wafer level hot carrier degradation - High accuracy, low noise, the ability to stress multiple transistors in parallel and measure small degradations

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Home / applications / Wafer level hot carrier degradation - High accuracy, low noise, the ability to stress multiple transistors in parallel and measure small degradations

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Products for Sale Online
Current/Voltage Source and Measure Products
Data Acquisition Modules/Cards
Digital Multimeters and Data Acquisition/Switching Systems
Fast Transient Response and High Voltage Power Supplies
IEEE-488 Communications
Instrument Accessories
Low Current/High Resistance Measurement Products
Low Voltage/Low Resistance Measurement Products
Optoelectronic Test Solutions
PCI/ISA/PCMCIA Accessories
Function/Pulse/Arbitrary/Pattern Generators
PXI Products
RF Spectrum Analysis, Signal Generation, and Switching
Semiconductor Parametric Test and Device Characterization
Software
Switching and Control
Obsolete

Products

Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond