Advanced particle beam methods for nano-characterization and analysis
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TITLE: Advanced particle beam methods for nano-characterization and analysis
SPEAKER: Dr. Jens Greiser, FEI Company, Eindhoven, The Netherlands
ABSTRACT
Every historic era has had its material building blocks from which visionaries and pioneers pursued new ideas and concepts by understanding the relationship between the properties and required functions of materials. Today, nanotechnology is ultimately linking properties and functions by understanding, manipulating, and shaping microstructures down to the atomic level. Nanotechnology is changing material design rules from empirical-based approaches into knowledge-based problem-solving.
As business opportunities in the nano economy go hand in hand with knowledge creation, tools are required to deliver high content visualizations and, for example, reliable and fast electrical or chemical information. Long before the nanotechnology era was widely acknowledged, FEI tools have been used extensively for characterizing, analyzing and measuring or prototyping structures at the nanoscale level (with at least one dimension of less than 100 nm) and down to the angstrom or atomic level.
This presentation shows case studies on how nanotechnology is progressing from the industrial research environment into product design and development. The capabilities of some new nano-imaging and prototyping tools are also discussed.
In addition, global trends and value drivers of nanotechnologies in research and industry are discussed.
SPEAKER BIO
| Jens Greiser manages the Strategic Marketing of FEI Company, focusing on nano research and industry. He is based in The Netherlands and his responsibilities cover the analysis of emerging business opportunities in nano-driven industrial markets, as well as shaping long-term roadmaps. He has more than 10 years experience in the nanotechnology instrument equipment market in a variety of roles. Greiser graduated in Solid State Physics (Dipl.-Phys.) and received his PhD in Materials Sciences in 1999 from the Chemistry department of the University of Stuttgart. His PhD work was related to thin film technology and novel characterization methods at the nanoscale level. The work was done at the Max Planck Institute for Metals Research in Stuttgart. |
COMPANY INFORMATION
FEI Europe Main Office
Europe Nanoport
Achtseweg Noord 5, Bldg Aae
5651 Gg Eindhoven
The Netherlands
Phone: +31 40 23 56000
Fax: +31 40 23 56612
Sales: +31 40 23 56504
Customer Service: +31 40 23 56924
Web: www.fei.com
FEI is a global leader in providing innovative instruments for nanoscale imaging, analysis, and prototyping. FEI focuses on delivering solutions that provide groundbreaking results and accelerate research, development, and manufacturing cycles for its customers in the Semiconductor and Data Storage, Academic and Industrial R&D, and Life Sciences markets. With R&D centers in North America, Europe, and India, and sales and service operations in more than 50 countries around the world, FEI's Tools for NanotechTM are bringing the nanoscale within the grasp of leading researchers and manufacturers.
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