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How to Avoid Self-Heating Effects on Nanoscale Devices

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TITLE: How to Avoid Self-Heating Effects on Nanoscale Devices

SPEAKER: John Tucker, Lead Marketing Engineer: Nanotechnology, Research, & Education, Keithley Instruments, Cleveland, OH USA

Nanoelectronics is a rapidly developing field with potential impact across a wide range of industries. Devices such as carbon nanotubes, semiconductor nanowires, graphene-based electronics, molecular organic-based electronics, and single electron devices are routinely researched and characterized today. Characterizing the electrical properties of these delicate nanoelectronic components and materials requires instrumentation and measurement techniques optimized for low power measurements. Low temperature materials, nanodevices, and sub-micron silicon structures can be easily be altered or even destroyed by the heat generated from excessive power sourced by the instrumentation that is used to measure resistance (R) and I-V characteristics. Traditional DC techniques are also not adequate to reveal how devices really operate. Consequently, different testing techniques are needed for the new era of nanoelectronic devices.

One such technique is known as pulsed testing. Pulsed electrical testing is a measurement technique that reduces the total energy dissipated in a device, and thus the potential for damage. The device under test (DUT) is excited for a very short interval with a source high enough to produce a quality measurable signal and then the source is removed. This type of pulsed testing is essential for the next generation of “beyond CMOS” nanoelectronic devices. This presentation will review pulse testing techniques and equipment to solve these measurement challenges.


Jonathan Tucker is the Lead Marketing Engineer for Nanotechnology, Research and Education and the Sensitive Measurements Product Line Manager at Keithley Instruments in Cleveland, Ohio. He joined Keithley Instruments in 1987 and has held numerous positions, including Test Engineer, Applications Engineer, Applications Manager, and Product Marketer. His current focus is business strategy and product development of electrical characterization and measurement tools for nanotechnology applications.

Jonathan is the Co-Chair of the IEEE Nanoelectronics Standards Roadmap effort, dedicated to the development of standards to aid in the commercialization of nano-scaled electronics. He also supported and co-authored the release of IEEE 1650TM-2005, IEEE Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes, the world’s first nanotechnology measurement standard. Jonathan is a member of the Board of Advisors for the Cleveland Nano-Network. He holds a Bachelor of Electrical Engineering degree from Cleveland State University and an MBA from Kent State University.

Event Length: Approximately 30 minutes

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Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, Ohio 44139 USA
Phone: (440) 248-0400
Toll-free: (800) 552-1115
Fax: (440) 248-6168
email: info@keithley.com
Web: http://www.keithley.com

Keithley Instruments, Inc. designs, develops, manufactures and markets complex electronic instruments and systems geared to the specialized needs of electronics manufacturers for high-performance production testing, process monitoring, product development and research. The Company has approximately 500 products used to source, measure, connect, control, or communicate direct current (DC), radio frequency (RF), or optical signals. Product offerings include integrated systems solutions, along with instruments and personal computer (PC) plug-in boards that can be used as system components or stand-alone solutions. The Company's customers are engineers, technicians, and scientists in manufacturing, product development, and research functions.

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