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IEEE International Conference on Microelectronic Test Structures (ICMTS)

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March 24-27, 2008. The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions.

Show Dates: March 24-27, 2008

Location: Edinburgh, UK

Facility: Appleton Tower, University of Edinburgh


The 2008 IEEE International Conference on Microelectronic Test
Structures (ICMTS) will be held at the University of Edinburgh,
which recently celebrated its 400th anniversary. ICMTS has come of
age and this meeting celebrates its 21st anniversary by visiting Edin-
burgh for the second time. The conference is being run in cooperation
with the University of Edinburgh and the Scottish Microelectronics
Centre. As was the case for the rst ICMTS conference, it is is being
sponsored by the IEEE Electron Devices Society, and for the rst time
the meeting is also being technically co-sponsored by the IEEE Solid
State Circuits Society.


Keithley experts will be on hand to discuss your test and measurement challenges, while displaying some of the latest and most exciting products.



Demonstrations of Keithley Products will be listed soon!

 

To register: click here

General Show Information: click here