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IRPS (International Reliability Physics Symposium)

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April 29 - May 1, 2008. For over 40 years, IRPS has been the premiere conference for engineers and scientists to present new and original work in the area of microelectronic device reliability.

Show Dates: April 29 - May 1, 2008


Location: Phoenix, AZ (USA)


Facility: Phoenix Convention Center & Hyatt Regency Phoenix


Booth Number: To be announced


Originally started in the early 1960’s by the military and aerospace community, IRPS is now co-sponsored by the IEEE Reliability Society and the IEEE Electron Devices Society. This co-sponsored event has drawn participants from the United States, Europe, Asia and all other parts of the world. IRPS 2008 promotes the reliability and performance of integrated circuits and microelectronic assemblies through an improved understanding of failure mechanisms in the user’s environment, while demonstrating the latest state-of-the-art developments in electronic reliability.


We will have experts on hand to discuss your test and measurement challenges, while displaying some of the latest and most exciting products.


Demonstrations of Keithley Products during this show will include:

    • Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond

    • Model 2636 Dual-channel System SourceMeter Instrument (Low Current)


    General Show Information: click here 

    Registration:  click here

    Free Exhibit Hall Pass: click here