List Price             $990                                                                    
Part Number        TRN-4200-1-K     

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Who Should Attend:

Engineers, technicians, and university students who use the 4200-SCS product and wish to learn how to optimize its use for their application. 

Overview: 

This two-day course provides users with a detailed understanding of the primary functions of the 4200 semiconductor characterization system. Participants will learn how to use the source and measure capabilities to meet a variety of test requirements. Also included are an in-depth review of the KITE software platform and how to create and re-use Interactive Test Modules (ITMs). Practical examples using various device types will be included. Additional topics include measurement optimization and troubleshooting. The session consists of lectures, discussions, and hands-on labs.

Prerequisites:

• Experience with performing electrical measurements. Little or no experience with 4200-SCS operation.

 
What You’ll Learn:

After attending this course, users should be able to:

• Understand the key performance specifications
• Select the optimum setups for your specific tests
• Efficiently use the KITE software interface
• Create, modify, and re-use projects with Interactive Test Modules (ITMs)
• Determine the optimal speed vs noise tradeoff for your application
• Identify and resolve common measurement problems

 Course Benefits:

• Reduce test time by utilizing different operating modes of the instrument
• Increase productivity by learning optimal instrument setup to characterize a variety of devices.
• Get projects done faster by learning built-in automation features.
• Avoid measurement errors by learning potential pitfalls and proper measurement techniques.

Course Outline:

• Principles of operation and specifications
• Product operation
• Using the Keithley Interactive Test Environment (KITE) interface
• Using User Test Modules (UTM) and Interactive Test Modules (ITM)
• Building a new project
• Taking measurements, saving data and graphs
• Optimizing measurements by understanding accuracy vs speed
• Understanding and eliminating measurement errors
• Measurement troubleshooting
• Open forum on user test applications and challenges