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Semiconductor Parametric Analyzers

Semiconductor characterization systems that maximize productivity in R&D

For parametric testing that maximizes the productivity of technicians and engineers in R&D, the Model 4200-SCS Semiconductor Characterization System combines lab-grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution in a fully integrated characterization system. Our parametric analyzers include the Model 4210-CVU Capacitance-Voltage Unit, Model 4225-PMU Ultra-Fast I-V Module, Model 4220-PGU Pulse Generator Unit, and Model 4225-RPM Remote Amplifier/Switch. Keithley's ACS Basic Edition software is optimized for component and discrete (packaged) semiconductor device testing.
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Bundled Solutions for Parametric Analysis

Model 4200-SCS-PK2 High Resolution IV & CV Bundled Characterization Solution
  • Semiconductor component characterization
  • Failure analysis
  • Easily adapted to new technology applications
  • Library of hundreds of standard device tests
  • Supports full range of Keithley SourceMeter instruments and more

4200-SCS Semiconductor Parameter Analyzer

Model 4200-SCS Semiconductor Characterization System
  • Intuitive Windows based user interface
  • Single instrument solution
  • I-V, C-V and pulse generation, and pulse I-V
  • Application libraries included for every technology
 
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CALL NUMBER
1-800-935-5595 (US Only)