4200-SCS Semiconductor Parameter Analyzer
Total solution for I-V, C-V, pulse characterization, and reliability testing
Fully characterize a device, material, or process with unprecedented measurement sensitivity and accuracy. Using one flexible system, you can perform all the required DC I-V, C-V, pulse, and ultra-fast I-V testing. This parametric tester is modular so you can configure it for your current test requirements and reconfigure it as test requirements change. For example, it supports up to eight source measurement units (SMUs), an optional remote PreAmp that extends resolution to 0.1fA, oscilloscopes, pulse generators, and more. It also offers an array of test software, including extensive test libraries and the Automated Characterization Suite (ACS) for reliability testing.
