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What kinds of measurement challenges do your nanotechnology applications present?
Nanotechnology research is advancing so rapidly that many scientists find that their existing measurement tools simply lack the sensitivity or resolution needed to characterize low level signals effectively. Others are scrambling to keep up with the rapid changes in measurement requirements that new discoveries create. No matter which challenge you're facing, Keithley can help.
 
NANOTECHNOLOGY PRODUCTS SELECTOR GUIDE
Which Keithley nanotechnology solution is best for your sourcing or measurement application? Click here to find out!
 

Need wider ranges for your nanoscale materials research?


Pictured above:
A four-wire connection to a carbon nanotube.
(Image reproduced courtesy of Zyvex Corporation.) 		During device development, structures like single electron transistors (SETs), sensors, and other experimental devices often display unique properties. Characterizing these properties without damaging one-of-a-kind structures requires systems that provide tight control over sourcing to prevent device self-heating. Keithley instrumentation combines this tight control with exceptional measurement speed and sensitivity in flexible, modular architectures that make it easy to adapt to changing test requirements.

 

Experimental nanostructures can't take the heat?


Pictured above:
A device formed by an array of gold nanoparticles.
Photo courtesy of K. Elteto and X.M. Lin, the University of Chicago. 		During device development, structures like single electron transistors (SETs), sensors, and other experimental devices often display unique properties. Characterizing these properties without damaging one-of-a-kind structures requires systems that provide tight control over sourcing to prevent device self-heating. Keithley instrumentation combines this tight control with exceptional measurement speed and sensitivity in flexible, modular architectures that make it easy to adapt to changing test requirements.

 

Preparing to make the leap into production?


Pictured above:
TiO2 nanotube
Image courtesy of Dr. Jiyoung Kim, University of Texas at Dallas. 		Our growing line of I-V characterization tools can help you make the jump from the lab into commercial production sooner. Their wide sourcing and measurement ranges allow you to study how next-generation nanoelectronics like carbon nanotube field-effect transistors (CNTFETs), SETs, and other exotic devices will perform under a variety of conditions.

 

Model 4200-SCS Semiconductor Characterization System


Keithley's Model 4200-SCS Semiconductor Characterization System is the Industry-Standard tool for Nanotechnology labs around the world.

FEATURES:
  • Conforms to IEEE P1650-2005 standard
  • Easy to use Windows™-based operation
  • A complete, integrated solution
  • Unmatched flexibility and adaptability
  • Nanotech Toolkit saves your set up time
Product Page  |  Product Specs  |  Product Demo  |  Product Brochure
 
The Model 4200-SCS conforms to and supports the IEEE P1650™ - 2005 Standard: "IEEE Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes", the world's first electrical measurement standard for Carbon Nanotubes.
 

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