Keithley News Releases

Williams Receives 2013 IEEE Joseph F. Keithley Award
Cleveland, Ohio – May 16, 2013 – The IEEE has named Dr. Dylan Forrest Williams as the recipient of the 2013 IEEE Joseph F. Keithley Award in Instrumentation and Measurement.

New Poster Offers Guidance on Maximizing Power Supply Performance
Cleveland, Ohio – April 2, 2013 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published a poster to help engineers and researchers utilize techniques that will enhance the performance of their power supplies in applications in research, design, and high-speed production test.

Keithley Adds High Power Wafer-Level Testing to Automated Characterization Suite Software
Cleveland, Ohio - March 26, 2013 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announces enhancements to its Automated Characterization Suite (ACS) software that support its expanding family of high power semiconductor characterization solutions.

Keithley Parametric Curve Tracer Honored as a 2012 "Product of the Year"
Cleveland, Ohio – March 5, 2013 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today that the editors of Electronic Products magazine have honored the company's new Parametric Curve Tracer (PCT) Configurations as a "Product of the Year" award winner for 2012 in the test and measurement category.

Keithley's Model 2657A High Power System SourceMeter® SMU Instrument Named One of EDN's 2012 Hot 100 Products
Cleveland, Ohio – February 5, 2013 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today that the editors of EDN Magazine have named the Model 2657A High Power System SourceMeter instrument as one of the "100 Hot Products of 2012."

Keithley Combines a Curve Tracer's Range and Simplicity with a Parameter Analyzer's Flexibility and Precision
Cleveland, Ohio – October 22, 2012 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced seven instrumentation, software, and test fixture configurations for parametric curve tracing applications for characterizing high power devices at up to 3,000V and 100A.

Economical Dual- and Triple-Channel Programmable Power Supplies from Keithley Outperform More Costly Competitive Supplies
0.03% basic voltage and 0.1% basic current readback accuracy for higher data confidence • Isolated and independent outputs for greater testing flexibility • Easier to interpret displays

Keithley Introduces Dual-Channel Picoammeter/Voltage Source with Ultra-Low Current Resolution
Cleveland, Ohio – October 15, 2012 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, expands its low level measurement leadership by introducing a dual-channel picoammeter with dual ±30V independent, non-floating bias sources and 1fA measurement resolution.

Keithley Expands SourceMeter SMU Instrument Line with Three New Models Optimized for Benchtop Applications
CLEVELAND, OHIO – September 17, 2012 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced three new economical source measurement unit (SMU) instruments suited for benchtop and R&D applications to its Series 2600B System SourceMeter SMU Instrument line, which now includes new capabilities that enhance productivity and ease of use.

Keithley Expands DMM Line, Adding Economical, Programmable 5-1/2-Digit Digital Multimet
CLEVELAND, OHIO – September 17, 2012 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, continues to build on its long history in digital multimeter (DMM) design with an economical new offering.

Keithley Donation to Oregon State University Solar Vehicle Team Boosts Power by 50 Percent
CLEVELAND, OHIO - July 26, 2012 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, is helping the electrical engineers of tomorrow characterize photovoltaic devices accurately and efficiently.

Keithley Earns Metrology Reaccreditation, is among the First Labs to Earn New U.S. Accreditation
Cleveland, Ohio - September 8, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has announced that its Metrology Services department has achieved renewal of its ISO 17025 accreditation, having successfully completed a rigorous three-and-a-half-day ISO 17025 re-accreditation assessment by A2LA (American Association for Laboratory Accreditation).

New Keithley Switch Mainframes Boost System Throughput for Semiconductor Test Applications
Cleveland, Ohio - September 1, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has introduced the six-slot Model 707B and single-slot Model 708B switch matrix mainframes, which are optimized for semiconductor test applications in both lab and production environments.

Keithley Instruments’ Executive to Address Production Innovation Management Conference
Cleveland, Ohio - August 25, 2010 - Larry Pendergrass, vice president of new product development at Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will be among the presenters at the 34th Annual Global Conference on Product Innovation Management.

EDN.COM Publishes Keithley Instruments’ Executive’s Product Development Leadership Blog
Cleveland, Ohio – August 12, 2010 – EDN.com, the online home of Electronic News, EDN, and Electronic Business magazines, has begun publishing a monthly blog written by Larry Pendergrass, vice president of new product development at Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems.

Keithley Introduces Low-Cost, Full-Featured USB-to-GPIB Interface Adapter
Cleveland, Ohio - June 24, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has introduced the Model KUSB-488B USB-to-GPIB Interface Adapter.

Keithley Offers Free CD of Nanotechnology Test Tutorials
Cleveland, Ohio – June 16, 2010 – Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced its new Nanotechnology Technical Test Library on CD.

Keithley's New Reed Relay Matrix Card Combines Ultra-High Density and Superior Configuration Flexibility
Cleveland, Ohio - May 13, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced the Model 3732 Quad 4x28 Ultra-High Density Reed Relay Matrix Card.

Free Keithley Web-Based Seminar Explores New Measurement Techniques and Capabilities for Testing Flash Memory
Cleveland, Ohio - May 11, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "New Methods for Testing Flash Memory" on Thursday, May 20, 2010.

Free Keithley Web-Based Seminar Reveals Secrets for Getting Good C-V Measurement Results
Cleveland, Ohio - March 18, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing" on Thursday, March 25, 2010.

Free Keithley Web-Based Seminar Offers Fundamental Information on Phase Change Memory
Cleveland, Ohio - March 15, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, offers a free, web-based seminar titled "Phase Change Memory - Fundamentals and Measurement Techniques."

Keithley Publishes Digital Multimeter Technical Library on CD
Cleveland, Ohio - March 10, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, has published a digital multimeter (DMM) technical library for engineers and researchers who use DMMs for a wide range of applications.

Keithley's Ultra-Fast Current-Voltage System Combines Three Essential Characterization Capabilities in One Chassis
Cleveland, Ohio - February 18, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced the Model 4225-PMU Ultra-Fast I-V Module, the latest addition to the growing range of instrumentation options for the Model 4200-SCS Semiconductor Characterization System.

LeCroy Chooses Keithley RF/Microwave Switch for Its Superspeed USB 3.0 Test Suite
CLEVELAND, OH - February 3, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, announced today that LeCroy Corporation, a leading producer of serial data test solutions, has chosen Keithley's System 46 (S46) RF/Microwave Switch System as part of the original equipment for its new USB 3.0 Test Suite product family.

Keithley Instruments' Solar Cell Testing Survey Shows Priorities and Best Practices in Test Methods
Cleveland, OH - January 25, 2010 - A recent survey of solar cell/photovoltaic device researchers and manufacturers working in government, university-based, and corporate labs and manufacturing facilities indicates distinct differences in testing methods and priorities among respondents from Asia, North America, and Europe.

Free Keithley Web-Based Seminar Illustrates Best Practices for On-Wafer Probing
Cleveland, Ohio - January 19, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips, Tricks, and Traps for On-Wafer Probing" on Thursday, January 28, 2010.

Keithley Publishes 2010 Test & Measurement Product Catalog CD
Cleveland, Ohio - January 13, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has published its 2010 Test & Measurement Product Catalog in CD form.