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Keithley Expands Programmable DC Power Supply Lines with Higher Power and Performance
CLEVELAND, OH – June 24, 2014 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today the new Series 2260B Programmable DC Power Supplies, which include two 360W and two 720W models.

Keithley Expands Programmable DC Power Supply Lines with Higher Power and Performance
CLEVELAND, OH – June 24, 2014 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today the new Series 2260B Programmable DC Power Supplies, which include two 360W and two 720W models.

New Keithley Power Supplies Allow Safe Breakdown Testing at up to 10kV
CLEVELAND, OH – March 19, 2014 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, today introduced two high voltage power supplies optimized for high voltage device and materials testing and high energy physics and materials science research.

Keithley Adds Two GPIB-Programmable Power Supplies to Series 2200 Line
CLEVELAND, OH – February 18, 2014 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today the addition of two multi-channel power supplies with GPIB interfaces to its line of programmable DC power supplies.

Keithley Publishes Seventh Edition of Popular Low Level Measurements Handbook
Cleveland, Ohio – January 30, 2014 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today that it has published the seventh edition of its well-regarded Low Level Measurements Handbook: Precision DC Current, Voltage, and Resistance Measurements.

Keithley Enhances S530 Parametric Test System Capabilities with Software Upgrade
Cleveland, Ohio – January 14, 2014 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, introduced today the latest upgrades to its popular S530 Parametric Test Systems, the semiconductor industry's most cost-effective solution for high-speed production parametric test.

Keithley Introduces World's First Source Measure Unit Instrument with an Interactive Touchscreen Display
Cleveland, Ohio - August 14, 2013 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, today announces the first benchtop Source Measure Unit (SMU) instrument with a capacitive touchscreen graphical user interface.

Keithley Wins Twenty-Third R&D 100 Award for High Power SMU Instrument
Cleveland, Ohio – August 8, 2013 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today that its Model 2657A High Power System SourceMeter® Source Measure Unit (SMU) Instrument has received the R&D 100 Award from R&D (Research & Development) magazine.

Free Keithley Web-Based Seminar Teaches Low Level DC Measurement Techniques
Cleveland, Ohio – July 31, 2013 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, is offering a free, web-based seminar titled "Techniques for Making Successful Low Level DC Measurements."

Keithley Earns Metrology Reaccreditation, is among the First Labs to Earn New U.S. Accreditation
Cleveland, Ohio - September 8, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has announced that its Metrology Services department has achieved renewal of its ISO 17025 accreditation, having successfully completed a rigorous three-and-a-half-day ISO 17025 re-accreditation assessment by A2LA (American Association for Laboratory Accreditation).

New Keithley Switch Mainframes Boost System Throughput for Semiconductor Test Applications
Cleveland, Ohio - September 1, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has introduced the six-slot Model 707B and single-slot Model 708B switch matrix mainframes, which are optimized for semiconductor test applications in both lab and production environments.

Keithley Instruments’ Executive to Address Production Innovation Management Conference
Cleveland, Ohio - August 25, 2010 - Larry Pendergrass, vice president of new product development at Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will be among the presenters at the 34th Annual Global Conference on Product Innovation Management.

EDN.COM Publishes Keithley Instruments’ Executive’s Product Development Leadership Blog
Cleveland, Ohio – August 12, 2010 – EDN.com, the online home of Electronic News, EDN, and Electronic Business magazines, has begun publishing a monthly blog written by Larry Pendergrass, vice president of new product development at Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems.

Keithley Introduces Low-Cost, Full-Featured USB-to-GPIB Interface Adapter
Cleveland, Ohio - June 24, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has introduced the Model KUSB-488B USB-to-GPIB Interface Adapter.

Keithley Offers Free CD of Nanotechnology Test Tutorials
Cleveland, Ohio – June 16, 2010 – Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced its new Nanotechnology Technical Test Library on CD.

Keithley's New Reed Relay Matrix Card Combines Ultra-High Density and Superior Configuration Flexibility
Cleveland, Ohio - May 13, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced the Model 3732 Quad 4x28 Ultra-High Density Reed Relay Matrix Card.

Free Keithley Web-Based Seminar Explores New Measurement Techniques and Capabilities for Testing Flash Memory
Cleveland, Ohio - May 11, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "New Methods for Testing Flash Memory" on Thursday, May 20, 2010.

Free Keithley Web-Based Seminar Reveals Secrets for Getting Good C-V Measurement Results
Cleveland, Ohio - March 18, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing" on Thursday, March 25, 2010.

Free Keithley Web-Based Seminar Offers Fundamental Information on Phase Change Memory
Cleveland, Ohio - March 15, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, offers a free, web-based seminar titled "Phase Change Memory - Fundamentals and Measurement Techniques."

Keithley Publishes Digital Multimeter Technical Library on CD
Cleveland, Ohio - March 10, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, has published a digital multimeter (DMM) technical library for engineers and researchers who use DMMs for a wide range of applications.

Keithley's Ultra-Fast Current-Voltage System Combines Three Essential Characterization Capabilities in One Chassis
Cleveland, Ohio - February 18, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced the Model 4225-PMU Ultra-Fast I-V Module, the latest addition to the growing range of instrumentation options for the Model 4200-SCS Semiconductor Characterization System.

LeCroy Chooses Keithley RF/Microwave Switch for Its Superspeed USB 3.0 Test Suite
CLEVELAND, OH - February 3, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, announced today that LeCroy Corporation, a leading producer of serial data test solutions, has chosen Keithley's System 46 (S46) RF/Microwave Switch System as part of the original equipment for its new USB 3.0 Test Suite product family.

Keithley Instruments' Solar Cell Testing Survey Shows Priorities and Best Practices in Test Methods
Cleveland, OH - January 25, 2010 - A recent survey of solar cell/photovoltaic device researchers and manufacturers working in government, university-based, and corporate labs and manufacturing facilities indicates distinct differences in testing methods and priorities among respondents from Asia, North America, and Europe.

Free Keithley Web-Based Seminar Illustrates Best Practices for On-Wafer Probing
Cleveland, Ohio - January 19, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips, Tricks, and Traps for On-Wafer Probing" on Thursday, January 28, 2010.

Keithley Publishes 2010 Test & Measurement Product Catalog CD
Cleveland, Ohio - January 13, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has published its 2010 Test & Measurement Product Catalog in CD form.