Keithley News Releases

Keithley Instruments Adds Site for India to Growing List of International Websites
CLEVELAND, OH – October 24, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, now has a new website created for its customers, prospective customers, and users of its products in India, www.keithley.in.

Keithley Publishes CD on High Performance Source Measurement Solutions
CLEVELAND, OH – October 12, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative CD entitled, "Configuring Cost-Effective, High Performance Sourcing and Measurement Solutions."

KeithleyCare Repair and Calibration Service Plans Cut Costs, Reduce Downtime, and Protect Instrument Investments
CLEVELAND, OH - October 5, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced KeithleyCare Plans to provide owners of Keithley instrumentation with fast, high quality instrument calibration and repair services at a fraction of the cost of "per-event" service.

Keithley Adds Support for Non-Volatile Memory, Very Low Frequency C-V, and Increased Parallel Testing to Semiconductor Parameter Analyzer
CLEVELAND, Ohio – September 29, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced a variety of enhancements for its award-winning Model 4200-SCS Semiconductor Characterization System.

Keithley Expands Series 2400 SourceMeter® Family with Lower-Cost Solution Optimized for Low Voltage Testing
CLEVELAND, OH – September 19, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today a low-cost addition to its popular Series 2400 SourceMeter® instrument family.

Keithley Upgrades Semiconductor Test Software for High Throughput Wafer Production Test
CLEVELAND, OH – September 19, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced an upgrade to its popular Keithley Test Environment (KTE) semiconductor test software.

Keithley Launches New General Purpose Programmable Power Supply Product Line
CLEVELAND, OH – September 19, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today the availability of five new general-purpose programmable DC power supplies designed to complement the company's existing line of specialty power supplies and source measurement instruments for component, module, and device characterization and test applications.

Keithley Instruments to Sponsor Conference on Silicon Carbide and Related Materials
CLEVELAND, Ohio – September 9, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today that it will be a major sponsor and an exhibitor at the International Conference on Silicon Carbide and Related Materials (ICSCRM) coming to Cleveland.

Keithley Publishes Low Voltage, Low Resistance Measurements E-Handbook
CLEVELAND, Ohio – August 22, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an electronic handbook titled "Making Precision Low Voltage and Low Resistance Measurements."

Ultra-Fast Current-Voltage System Wins Keithley Instruments Its Twenty-Second R&D 100 Award
CLEVELAND, Ohio – July 20, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today that the editors of R&D magazine have presented the company with its twenty-second R&D 100 Award – this time for the Model 4225-PMU Ultra Fast I-V Module, which was introduced in 2010.

Free Keithley Web-Based Seminar Explores Production Test Switching System Tips and Techniques
CLEVELAND, Ohio – July 15, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips and Techniques for Designing Cost-Effective, Efficient Switch Systems" on Tuesday, July 26, 2011.

Keithley Publishes Online Nanotechnology Seminars on CD
CLEVELAND, Ohio – June 20, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has assembled a new collection of its nanotechnology-focused web tutorials and seminars in a convenient CD format.

Free Keithley Web-Based Seminar Explores Electrical Characterization of Solar Cells
CLEVELAND, Ohio – June 16, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Understanding Electrical Characterization of Solar Cells" on Thursday, June 30, 2011.

Keithley Publishes E-Guide About High Performance Source-Measure Solutions
CLEVELAND, Ohio - June 8, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative e-guide titled "Cost-effective, high performance sourcing and measurement solutions."

Free Keithley Web-Based Seminar Addresses High Brightness LED Test Techniques


Keithley Publishes E-Handbook on Precision Low Current, High Resistance Measurements
CLEVELAND, Ohio - April 27, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative e-handbook titled "Making Precision Low Current and High Resistance Measurements."

Keithley Publishes E-Handbook on Nanoscale Electrical Measurements
Cleveland, Ohio - April 19, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative e-handbook titled "Ensuring the Accuracy of Nanoscale Electrical Measurements."

Keithley Introduces System SourceMeter Instrument Optimized for High Power Semiconductor Test
Cleveland, Ohio - April 4, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, today introduced the Model 2651A High Power System SourceMeter instrument, the latest addition to the company's Series 2600A System SourceMeter family.

Free Keithley Web-Based Seminar Addresses High Voltage Wafer Level Test Techniques
CLEVELAND, Ohio – April 1, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "High Voltage Wafer Level Test - Tips, Tricks, and Pitfalls" on Thursday, April 14, 2011.

Free Keithley Web-Based Seminar Explores Graphene Characterization Techniques
CLEVELAND, Ohio – March 16, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Mastering Low Power, Low Voltage, Low Resistance Measurement Techniques for Characterizing Graphene and Other Nano Materials" on Thursday, March 24, 2011.

Keithley Publishes Online Tutorial Seminars on CD
CLEVELAND, Ohio – March 10, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has assembled a collection of its most popular web tutorials and seminars in a convenient CD format.

Keithley University Offers Free Tutorial Webcasts
CLEVELAND, Ohio - March 2, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announces "Keithley University," a series of tutorial webcasts that cover best practices for making even the most demanding measurements.

Keithley Releases Four New "How-To" Videos on Operating Electrometers
CLEVELAND, Ohio – February 15, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has produced a series of four new tutorial videos on topics related to configuring and operating one of its most sensitive measurement instruments.

Keithley Earns Metrology Reaccreditation, is among the First Labs to Earn New U.S. Accreditation
Cleveland, Ohio - September 8, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has announced that its Metrology Services department has achieved renewal of its ISO 17025 accreditation, having successfully completed a rigorous three-and-a-half-day ISO 17025 re-accreditation assessment by A2LA (American Association for Laboratory Accreditation).

New Keithley Switch Mainframes Boost System Throughput for Semiconductor Test Applications
Cleveland, Ohio - September 1, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has introduced the six-slot Model 707B and single-slot Model 708B switch matrix mainframes, which are optimized for semiconductor test applications in both lab and production environments.

Keithley Instruments’ Executive to Address Production Innovation Management Conference
Cleveland, Ohio - August 25, 2010 - Larry Pendergrass, vice president of new product development at Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will be among the presenters at the 34th Annual Global Conference on Product Innovation Management.

EDN.COM Publishes Keithley Instruments’ Executive’s Product Development Leadership Blog
Cleveland, Ohio – August 12, 2010 – EDN.com, the online home of Electronic News, EDN, and Electronic Business magazines, has begun publishing a monthly blog written by Larry Pendergrass, vice president of new product development at Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems.

Keithley Introduces Low-Cost, Full-Featured USB-to-GPIB Interface Adapter
Cleveland, Ohio - June 24, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has introduced the Model KUSB-488B USB-to-GPIB Interface Adapter.

Keithley Offers Free CD of Nanotechnology Test Tutorials
Cleveland, Ohio – June 16, 2010 – Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced its new Nanotechnology Technical Test Library on CD.

Keithley's New Reed Relay Matrix Card Combines Ultra-High Density and Superior Configuration Flexibility
Cleveland, Ohio - May 13, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced the Model 3732 Quad 4x28 Ultra-High Density Reed Relay Matrix Card.

Free Keithley Web-Based Seminar Explores New Measurement Techniques and Capabilities for Testing Flash Memory
Cleveland, Ohio - May 11, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "New Methods for Testing Flash Memory" on Thursday, May 20, 2010.

Free Keithley Web-Based Seminar Reveals Secrets for Getting Good C-V Measurement Results
Cleveland, Ohio - March 18, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing" on Thursday, March 25, 2010.

Free Keithley Web-Based Seminar Offers Fundamental Information on Phase Change Memory
Cleveland, Ohio - March 15, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, offers a free, web-based seminar titled "Phase Change Memory - Fundamentals and Measurement Techniques."

Keithley Publishes Digital Multimeter Technical Library on CD
Cleveland, Ohio - March 10, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, has published a digital multimeter (DMM) technical library for engineers and researchers who use DMMs for a wide range of applications.

Keithley's Ultra-Fast Current-Voltage System Combines Three Essential Characterization Capabilities in One Chassis
Cleveland, Ohio - February 18, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced the Model 4225-PMU Ultra-Fast I-V Module, the latest addition to the growing range of instrumentation options for the Model 4200-SCS Semiconductor Characterization System.

LeCroy Chooses Keithley RF/Microwave Switch for Its Superspeed USB 3.0 Test Suite
CLEVELAND, OH - February 3, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, announced today that LeCroy Corporation, a leading producer of serial data test solutions, has chosen Keithley's System 46 (S46) RF/Microwave Switch System as part of the original equipment for its new USB 3.0 Test Suite product family.

Keithley Instruments' Solar Cell Testing Survey Shows Priorities and Best Practices in Test Methods
Cleveland, OH - January 25, 2010 - A recent survey of solar cell/photovoltaic device researchers and manufacturers working in government, university-based, and corporate labs and manufacturing facilities indicates distinct differences in testing methods and priorities among respondents from Asia, North America, and Europe.

Free Keithley Web-Based Seminar Illustrates Best Practices for On-Wafer Probing
Cleveland, Ohio - January 19, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips, Tricks, and Traps for On-Wafer Probing" on Thursday, January 28, 2010.

Keithley Publishes 2010 Test & Measurement Product Catalog CD
Cleveland, Ohio - January 13, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has published its 2010 Test & Measurement Product Catalog in CD form.