<?xml version="1.0"?>
<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
         xmlns:dc="http://purl.org/dc/elements/1.1/"
         xmlns:sy="http://purl.org/rss/1.0/modules/syndication/"
         xmlns="http://purl.org/rss/1.0/">
<channel rdf:about="http://www.keithley.com/news">

    <title>Keithley Instruments Inc. - Press Releases</title>
  <link>http://www.keithley.com</link>
  <description></description>
  <image rdf:resource="logo.jpg"/>
  <sy:updatePeriod>hourly</sy:updatePeriod>
  <sy:updateFrequency>1</sy:updateFrequency>
  <sy:updateBase>2007-01-01T05:00:00Z</sy:updateBase>
  <items>
    <rdf:Seq>
        
          
              <rdf:li resource="http://www.keithley.com/news/prod011310"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod012510"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod011910"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod021810"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod031510"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod031810"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod020310"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod051110"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod061610"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod062410"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/corp081210"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/corp082510"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod090110"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod090810"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod090910"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod092810"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod102110"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/corp110210"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod111510"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/corp111110"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/corp113010"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod051310"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod020711"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod012011"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod011211"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod120210"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod021511"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod040411"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod040111"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod031611"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod030211"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod031011"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod041911"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod042711"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod051811"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod060811"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod061611"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod062011"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod071511"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod072011"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod082211"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod090911"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod091911_1"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod091911_2"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod091911_3"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod100511"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod101211"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/corp102411"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod092911"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod011912"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod012512"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod031512"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/corp032012"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod032212"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/corp032812"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod032912"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod041712"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod100810"/>
          
          
              <rdf:li resource="http://www.keithley.com/news/prod031010"/>
          
        
   </rdf:Seq>
  </items>
</channel>


<item rdf:about="http://www.keithley.com/news/prod011310">
<title>Keithley Publishes 2010 Test &amp; Measurement Product Catalog CD</title>
<link>http://www.keithley.com/news/prod011310</link>
<description>Cleveland, Ohio - January 13, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has published its 2010 Test &amp; Measurement Product Catalog in CD form.</description>
<dc:rights></dc:rights>
<dc:date>2010-01-15T10:24+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod012510">
<title>Keithley Instruments' Solar Cell Testing Survey Shows Priorities and Best Practices in Test Methods</title>
<link>http://www.keithley.com/news/prod012510</link>
<description>Cleveland, OH - January 25, 2010 - A recent survey of solar cell/photovoltaic device researchers and manufacturers working in government, university-based, and corporate labs and manufacturing facilities indicates distinct differences in testing methods and priorities among respondents from Asia, North America, and Europe. </description>
<dc:rights></dc:rights>
<dc:date>2010-01-25T16:16+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod011910">
<title>Free Keithley Web-Based Seminar Illustrates Best Practices for On-Wafer Probing</title>
<link>http://www.keithley.com/news/prod011910</link>
<description>Cleveland, Ohio - January 19, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips, Tricks, and Traps for On-Wafer Probing" on Thursday, January 28, 2010.</description>
<dc:rights></dc:rights>
<dc:date>2010-01-19T09:15+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod021810">
<title>Keithley's Ultra-Fast Current-Voltage System Combines Three Essential Characterization Capabilities in One Chassis</title>
<link>http://www.keithley.com/news/prod021810</link>
<description>Cleveland, Ohio - February 18, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced the Model 4225-PMU Ultra-Fast I-V Module, the latest addition to the growing range of instrumentation options for the Model 4200-SCS Semiconductor Characterization System.</description>
<dc:rights></dc:rights>
<dc:date>2010-02-18T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod031510">
<title>Free Keithley Web-Based Seminar Offers Fundamental Information on Phase Change Memory</title>
<link>http://www.keithley.com/news/prod031510</link>
<description>Cleveland, Ohio - March 15, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, offers a free, web-based seminar titled "Phase Change Memory - Fundamentals and Measurement Techniques."  </description>
<dc:rights></dc:rights>
<dc:date>2010-03-15T08:35+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod031810">
<title>Free Keithley Web-Based Seminar Reveals Secrets for Getting Good C-V Measurement Results</title>
<link>http://www.keithley.com/news/prod031810</link>
<description>Cleveland, Ohio - March 18, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing" on Thursday, March 25, 2010. </description>
<dc:rights></dc:rights>
<dc:date>2010-03-18T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod020310">
<title>LeCroy Chooses Keithley RF/Microwave Switch for Its Superspeed USB 3.0 Test Suite</title>
<link>http://www.keithley.com/news/prod020310</link>
<description>CLEVELAND, OH - February 3, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, announced today that LeCroy Corporation, a leading producer of serial data test solutions, has chosen Keithley's System 46 (S46) RF/Microwave Switch System as part of the original equipment for its new USB 3.0 Test Suite product family.</description>
<dc:rights></dc:rights>
<dc:date>2010-02-03T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod051110">
<title>Free Keithley Web-Based Seminar Explores New Measurement Techniques and Capabilities for Testing Flash Memory</title>
<link>http://www.keithley.com/news/prod051110</link>
<description>Cleveland, Ohio - May 11, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "New Methods for Testing Flash Memory" on Thursday, May 20, 2010.</description>
<dc:rights></dc:rights>
<dc:date>2010-05-11T09:15+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod061610">
<title>Keithley Offers Free CD of Nanotechnology Test Tutorials</title>
<link>http://www.keithley.com/news/prod061610</link>
<description>Cleveland, Ohio – June 16, 2010 – Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced its new Nanotechnology Technical Test Library on CD. </description>
<dc:rights></dc:rights>
<dc:date>2010-06-16T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod062410">
<title>Keithley Introduces Low-Cost, Full-Featured USB-to-GPIB Interface Adapter</title>
<link>http://www.keithley.com/news/prod062410</link>
<description>Cleveland, Ohio - June 24, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has introduced the Model KUSB-488B USB-to-GPIB Interface Adapter.</description>
<dc:rights></dc:rights>
<dc:date>2010-06-24T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/corp081210">
<title>EDN.COM Publishes Keithley Instruments’ Executive’s Product Development Leadership Blog</title>
<link>http://www.keithley.com/news/corp081210</link>
<description>Cleveland, Ohio – August 12, 2010 – EDN.com, the online home of Electronic News, EDN, and Electronic Business magazines, has begun publishing a monthly blog written by Larry Pendergrass, vice president of new product development at Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems.</description>
<dc:rights></dc:rights>
<dc:date>2010-08-12T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/corp082510">
<title>Keithley Instruments’ Executive to Address Production Innovation Management Conference</title>
<link>http://www.keithley.com/news/corp082510</link>
<description>Cleveland, Ohio - August 25, 2010 - Larry Pendergrass, vice president of new product development at Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will be among the presenters at the 34th Annual Global Conference on Product Innovation Management.</description>
<dc:rights></dc:rights>
<dc:date>2010-08-25T00:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod090110">
<title>New Keithley Switch Mainframes Boost System Throughput for Semiconductor Test Applications</title>
<link>http://www.keithley.com/news/prod090110</link>
<description>Cleveland, Ohio - September 1, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has introduced the six-slot Model 707B and single-slot Model 708B switch matrix mainframes, which are optimized for semiconductor test applications in both lab and production environments.</description>
<dc:rights></dc:rights>
<dc:date>2010-09-01T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod090810">
<title>Keithley Earns Metrology Reaccreditation, is among the First Labs to Earn New U.S. Accreditation</title>
<link>http://www.keithley.com/news/prod090810</link>
<description>Cleveland, Ohio - September 8, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has announced that its Metrology Services department has achieved renewal of its ISO 17025 accreditation, having successfully completed a rigorous three-and-a-half-day ISO 17025 re-accreditation assessment by A2LA (American Association for Laboratory Accreditation).</description>
<dc:rights></dc:rights>
<dc:date>2010-09-08T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod090910">
<title>Free Keithley Web-Based Seminar Exposes the Secrets to Ensuring Accurate I-V Measurements</title>
<link>http://www.keithley.com/news/prod090910</link>
<description>Cleveland, Ohio - September 9, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips, Tricks, and Traps in Ultra-Fast I-V Semiconductor Characterization" on Thursday, September 16, 2010.</description>
<dc:rights></dc:rights>
<dc:date>2010-09-09T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod092810">
<title>Keithley ACS Basic Edition Version 1.2 Provides New Levels of Usability, Convenience, and Productivity for Semiconductor Test Applications</title>
<link>http://www.keithley.com/news/prod092810</link>
<description>Cleveland, OH - September 28, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced a new release of its ACS Basic Edition Semiconductor Parametric Test Software for semiconductor test and measurement applications.</description>
<dc:rights></dc:rights>
<dc:date>2010-09-28T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod102110">
<title>Free Keithley Web-Based Seminar Reveals How To Conquer Challenging High Brightness LEDs Measurements</title>
<link>http://www.keithley.com/news/prod102110</link>
<description>Cleveland, Ohio - October 21, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Overcoming the Electrical Measurement Challenges of High Brightness LEDs" on Thursday, October 28, 2010.</description>
<dc:rights></dc:rights>
<dc:date>2010-10-21T06:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/corp110210">
<title>Zoughi to Receive 2011 IEEE Joseph F. Keithley Award for Contributions to Microwave and Millimeter Wave Measurement Techniques</title>
<link>http://www.keithley.com/news/corp110210</link>
<description>Cleveland, Ohio – November 2, 2010 – The IEEE has named Dr. Reza Zoughi as the recipient of the 2011 IEEE Joseph F. Keithley Award in Instrumentation and Measurement.</description>
<dc:rights></dc:rights>
<dc:date>2010-11-02T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod111510">
<title>Free Keithley Web-Based Seminar Teaches Optimum Methods and Techniques for Making Electrical Resistivity Measurements</title>
<link>http://www.keithley.com/news/prod111510</link>
<description>Cleveland, Ohio - November 15, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "How to Make Electrical Resistivity Measurements of Bulk Materials: Conductors, Insulators, and Semiconductors" on Thursday, November 18, 2010.</description>
<dc:rights></dc:rights>
<dc:date>2010-11-15T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/corp111110">
<title>Keithley Instruments Hosts Applications Forum to Encourage Idea Exchange, Discussions Among Users</title>
<link>http://www.keithley.com/news/corp111110</link>
<description>CLEVELAND, Ohio - November 11, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, is hosting a forum designed to offer customers and users of Keithley instrumentation a central location for finding product support and exchanging applications insights via the web.</description>
<dc:rights></dc:rights>
<dc:date>2010-11-11T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/corp113010">
<title>Keithley Instruments Honored for International Entrepreneurship</title>
<link>http://www.keithley.com/news/corp113010</link>
<description>Cleveland, OH – November 30, 2010 – Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced that it has been honored by The International Entrepreneur (TiE) Ohio, in the international business category, which recognizes Ohio-headquartered multinational businesses that have expanded globally.</description>
<dc:rights></dc:rights>
<dc:date>2010-11-30T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod051310">
<title>Keithley's New Reed Relay Matrix Card Combines Ultra-High Density and Superior Configuration Flexibility</title>
<link>http://www.keithley.com/news/prod051310</link>
<description>Cleveland, Ohio - May 13, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced the Model 3732 Quad 4x28 Ultra-High Density Reed Relay Matrix Card. </description>
<dc:rights></dc:rights>
<dc:date>2010-05-13T09:15+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod020711">
<title>Free Keithley Webinar Teaches Fundamentals of Hall Effect Measurements</title>
<link>http://www.keithley.com/news/prod020711</link>
<description>CLEVELAND, Ohio - February 7, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free webinar on "Hall Effect Measurement Fundamentals" on Thursday, February 17, 2011.</description>
<dc:rights></dc:rights>
<dc:date>2011-02-07T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod012011">
<title>Keithley Instruments Enhances Throughput and Accuracy of S530 Parametric Test Systems</title>
<link>http://www.keithley.com/news/prod012011</link>
<description>Cleveland, Ohio – January 20, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, today introduced several enhancements to its line of S530 Parametric Test Systems, the most cost-effective fully automatic production parametric test solutions available to the semiconductor industry.</description>
<dc:rights></dc:rights>
<dc:date>2011-01-20T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod011211">
<title>Keithley Publishes 2011 Test &amp; Measurement Product Catalog CD</title>
<link>http://www.keithley.com/news/prod011211</link>
<description>CLEVELAND, Ohio - January 12, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published its 2011 Test &amp; Measurement Product Catalog in CD form.</description>
<dc:rights></dc:rights>
<dc:date>2011-01-12T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod120210">
<title>Free Keithley Webinar Teaches Fundamentals of Bias Temperature Instability Measurement Methods</title>
<link>http://www.keithley.com/news/prod120210</link>
<description>Cleveland, Ohio – December 2, 2010 – Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, webinar titled "Fundamentals of Bias Temperature Instability and State-of-the-Art Measurement Methods" on Thursday, December 16, 2010.</description>
<dc:rights></dc:rights>
<dc:date>2010-12-02T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod021511">
<title>Keithley Releases Four New "How-To" Videos on Operating Electrometers</title>
<link>http://www.keithley.com/news/prod021511</link>
<description>CLEVELAND, Ohio – February 15, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has produced a series of four new tutorial videos on topics related to configuring and operating one of its most sensitive measurement instruments.</description>
<dc:rights></dc:rights>
<dc:date>2011-02-15T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod040411">
<title>Keithley Introduces System SourceMeter Instrument Optimized for High Power Semiconductor Test</title>
<link>http://www.keithley.com/news/prod040411</link>
<description>Cleveland, Ohio - April 4, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, today introduced the Model 2651A High Power System SourceMeter instrument, the latest addition to the company's Series 2600A System SourceMeter family.</description>
<dc:rights></dc:rights>
<dc:date>2011-04-04T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod040111">
<title>Free Keithley Web-Based Seminar Addresses High Voltage Wafer Level Test Techniques</title>
<link>http://www.keithley.com/news/prod040111</link>
<description>CLEVELAND, Ohio – April 1, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "High Voltage Wafer Level Test - Tips, Tricks, and Pitfalls" on Thursday, April 14, 2011.</description>
<dc:rights></dc:rights>
<dc:date>2011-04-01T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod031611">
<title>Free Keithley Web-Based Seminar Explores Graphene Characterization Techniques</title>
<link>http://www.keithley.com/news/prod031611</link>
<description>CLEVELAND, Ohio – March 16, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Mastering Low Power, Low Voltage, Low Resistance Measurement Techniques for Characterizing Graphene and Other Nano Materials" on Thursday, March 24, 2011.</description>
<dc:rights></dc:rights>
<dc:date>2011-03-16T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod030211">
<title>Keithley University Offers Free Tutorial Webcasts</title>
<link>http://www.keithley.com/news/prod030211</link>
<description>CLEVELAND, Ohio - March 2, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announces "Keithley University," a series of tutorial webcasts that cover best practices for making even the most demanding measurements.</description>
<dc:rights></dc:rights>
<dc:date>2011-03-02T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod031011">
<title>Keithley Publishes Online Tutorial Seminars on CD</title>
<link>http://www.keithley.com/news/prod031011</link>
<description>CLEVELAND, Ohio – March 10, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has assembled a collection of its most popular web tutorials and seminars in a convenient CD format.</description>
<dc:rights></dc:rights>
<dc:date>2011-03-10T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod041911">
<title>Keithley Publishes E-Handbook on Nanoscale Electrical Measurements</title>
<link>http://www.keithley.com/news/prod041911</link>
<description>Cleveland, Ohio - April 19, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative e-handbook titled "Ensuring the Accuracy of Nanoscale Electrical Measurements."</description>
<dc:rights></dc:rights>
<dc:date>2011-04-19T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod042711">
<title>Keithley Publishes E-Handbook on Precision Low Current, High Resistance Measurements</title>
<link>http://www.keithley.com/news/prod042711</link>
<description>CLEVELAND, Ohio - April 27, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative e-handbook titled "Making Precision Low Current and High Resistance Measurements." </description>
<dc:rights></dc:rights>
<dc:date>2011-04-27T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod051811">
<title>Free Keithley Web-Based Seminar Addresses High Brightness LED Test Techniques</title>
<link>http://www.keithley.com/news/prod051811</link>
<description></description>
<dc:rights></dc:rights>
<dc:date>2011-05-18T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod060811">
<title>Keithley Publishes E-Guide About High Performance Source-Measure Solutions</title>
<link>http://www.keithley.com/news/prod060811</link>
<description>CLEVELAND, Ohio - June 8, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative e-guide titled "Cost-effective, high performance sourcing and measurement solutions." </description>
<dc:rights></dc:rights>
<dc:date>2011-06-08T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod061611">
<title>Free Keithley Web-Based Seminar Explores Electrical Characterization of Solar Cells</title>
<link>http://www.keithley.com/news/prod061611</link>
<description>CLEVELAND, Ohio – June 16, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Understanding Electrical Characterization of Solar Cells" on Thursday, June 30, 2011.</description>
<dc:rights></dc:rights>
<dc:date>2011-06-16T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod062011">
<title>Keithley Publishes Online Nanotechnology Seminars on CD</title>
<link>http://www.keithley.com/news/prod062011</link>
<description>CLEVELAND, Ohio – June 20, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has assembled a new collection of its nanotechnology-focused web tutorials and seminars in a convenient CD format.</description>
<dc:rights></dc:rights>
<dc:date>2011-06-20T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod071511">
<title>Free Keithley Web-Based Seminar Explores Production Test Switching System Tips and Techniques</title>
<link>http://www.keithley.com/news/prod071511</link>
<description>CLEVELAND, Ohio – July 15, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips and Techniques for Designing Cost-Effective, Efficient Switch Systems" on Tuesday, July 26, 2011.</description>
<dc:rights></dc:rights>
<dc:date>2011-07-15T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod072011">
<title>Ultra-Fast Current-Voltage System Wins Keithley Instruments Its Twenty-Second R&amp;D 100 Award</title>
<link>http://www.keithley.com/news/prod072011</link>
<description>CLEVELAND, Ohio – July 20, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today that the editors of R&amp;D magazine have presented the company with its twenty-second R&amp;D 100 Award – this time for the Model 4225-PMU Ultra Fast I-V Module, which was introduced in 2010.</description>
<dc:rights></dc:rights>
<dc:date>2011-07-20T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod082211">
<title>Keithley Publishes Low Voltage, Low Resistance Measurements E-Handbook</title>
<link>http://www.keithley.com/news/prod082211</link>
<description>CLEVELAND, Ohio – August 22, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an electronic handbook titled "Making Precision Low Voltage and Low Resistance Measurements." </description>
<dc:rights></dc:rights>
<dc:date>2011-08-22T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod090911">
<title>Keithley Instruments to Sponsor Conference on Silicon Carbide and Related Materials</title>
<link>http://www.keithley.com/news/prod090911</link>
<description>CLEVELAND, Ohio – September 9, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today that it will be a major sponsor and an exhibitor at the International Conference on Silicon Carbide and Related Materials (ICSCRM) coming to Cleveland.</description>
<dc:rights></dc:rights>
<dc:date>2011-09-09T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod091911_1">
<title>Keithley Launches New General Purpose Programmable Power Supply Product Line</title>
<link>http://www.keithley.com/news/prod091911_1</link>
<description>CLEVELAND, OH – September 19, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today the availability of five new general-purpose programmable DC power supplies designed to complement the company's existing line of specialty power supplies and source measurement instruments for component, module, and device characterization and test applications.</description>
<dc:rights></dc:rights>
<dc:date>2011-09-19T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod091911_2">
<title>Keithley Upgrades Semiconductor Test Software for High Throughput Wafer Production Test</title>
<link>http://www.keithley.com/news/prod091911_2</link>
<description>CLEVELAND, OH – September 19, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced an upgrade to its popular Keithley Test Environment (KTE) semiconductor test software.</description>
<dc:rights></dc:rights>
<dc:date>2011-09-19T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod091911_3">
<title>Keithley Expands Series 2400 SourceMeter® Family with Lower-Cost Solution Optimized for Low Voltage Testing</title>
<link>http://www.keithley.com/news/prod091911_3</link>
<description>CLEVELAND, OH – September 19, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today a low-cost addition to its popular Series 2400 SourceMeter® instrument family.</description>
<dc:rights></dc:rights>
<dc:date>2011-09-19T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod100511">
<title>KeithleyCare Repair and Calibration Service Plans Cut Costs, Reduce Downtime, and Protect Instrument Investments</title>
<link>http://www.keithley.com/news/prod100511</link>
<description>CLEVELAND, OH - October 5, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced KeithleyCare Plans to provide owners of Keithley instrumentation with fast, high quality instrument calibration and repair services at a fraction of the cost of "per-event" service.</description>
<dc:rights></dc:rights>
<dc:date>2011-10-05T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod101211">
<title>Keithley Publishes CD on High Performance Source Measurement Solutions</title>
<link>http://www.keithley.com/news/prod101211</link>
<description>CLEVELAND, OH – October 12, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative CD entitled, "Configuring Cost-Effective, High Performance Sourcing and Measurement Solutions."</description>
<dc:rights></dc:rights>
<dc:date>2011-10-12T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/corp102411">
<title>Keithley Instruments Adds Site for India to Growing List of International Websites</title>
<link>http://www.keithley.com/news/corp102411</link>
<description>CLEVELAND, OH – October 24, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, now has a new website created for its customers, prospective customers, and users of its products in India, www.keithley.in.</description>
<dc:rights></dc:rights>
<dc:date>2011-10-24T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod092911">
<title>Keithley Adds Support for Non-Volatile Memory, Very Low Frequency C-V, and Increased Parallel Testing to Semiconductor Parameter Analyzer</title>
<link>http://www.keithley.com/news/prod092911</link>
<description>CLEVELAND, Ohio – September 29, 2011 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced a variety of enhancements for its award-winning Model 4200-SCS Semiconductor Characterization System.</description>
<dc:rights></dc:rights>
<dc:date>2011-09-29T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod011912">
<title>Keithley Publishes 2012 Test &amp; Measurement Product Catalog</title>
<link>http://www.keithley.com/news/prod011912</link>
<description>CLEVELAND, OH – January 19, 2012 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published its 2012 Test &amp; Measurement Product Catalog.</description>
<dc:rights></dc:rights>
<dc:date>2012-01-19T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod012512">
<title>New Keithley Semiconductor Software Expands Support for Reliability/High Power Device Test</title>
<link>http://www.keithley.com/news/prod012512</link>
<description>CLEVELAND, OH - January 25, 2012 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has upgraded the capabilities of its Automated Characterization Suite (ACS) Test Environment.</description>
<dc:rights></dc:rights>
<dc:date>2012-01-25T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod031512">
<title>Free Keithley Web-Based Seminar Explores Ultra-Fast I-V Semiconductor Characterization</title>
<link>http://www.keithley.com/news/prod031512</link>
<description>CLEVELAND, OH – March 15, 2012 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips, Tricks, and Traps in Ultra-Fast I-V Semiconductor Characterization" on Thursday, March 22.</description>
<dc:rights></dc:rights>
<dc:date>2012-03-15T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/corp032012">
<title>Case School of Engineering Graduate Student Named 2012 Keithley Graduate Fellow for Advancing Research in Nanoscale Devices and Electronic Measurements</title>
<link>http://www.keithley.com/news/corp032012</link>
<description>Cleveland, Ohio - March 20, 2012 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has named Tina He as the recipient of the first annual Keithley Graduate Fellowship Award.</description>
<dc:rights></dc:rights>
<dc:date>2012-03-20T05:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod032212">
<title>Keithley Introduces High Voltage System SourceMeter Instrument Optimized for High Power Semiconductor Test</title>
<link>http://www.keithley.com/news/prod032212</link>
<description>CLEVELAND, Ohio – March 22, 2012 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, today introduced the Model 2657A High Power System SourceMeter instrument.</description>
<dc:rights></dc:rights>
<dc:date>2012-03-22T10:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/corp032812">
<title>Pintelon Receives 2012 IEEE Joseph F. Keithley Award for Innovative System Identification Methods for Measurement Applications</title>
<link>http://www.keithley.com/news/corp032812</link>
<description>CLEVELAND, OH - March 28, 2012 - The IEEE has named Dr. Rik Pintelon as the recipient of the 2012 IEEE Joseph F. Keithley Award in Instrumentation and Measurement.</description>
<dc:rights></dc:rights>
<dc:date>2012-03-28T10:30+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod032912">
<title>Keithley Expands Measurement Capability of S530 Parametric Test Systems</title>
<link>http://www.keithley.com/news/prod032912</link>
<description>Cleveland, Ohio - March 29, 2012 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, continues to enhance the capabilities of its S530 Parametric Test Systems, the semiconductor industry's most cost-effective solution for high speed production parametric test.</description>
<dc:rights></dc:rights>
<dc:date>2012-03-29T10:30+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod041712">
<title>Free Keithley Web-Based Seminar Explores Tips, Tricks, and Traps of Semiconductor C-V Testing</title>
<link>http://www.keithley.com/news/prod041712</link>
<description>CLEVELAND, OH - April 17, 2012 – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing" on Thursday, April 26, 2012.</description>
<dc:rights></dc:rights>
<dc:date>2012-04-17T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod100810">
<title>Nobel Winners in Physics Used Keithley Instrumentation in Prize-Winning Research</title>
<link>http://www.keithley.com/news/prod100810</link>
<description>Cleveland, OH - October 8, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, extends its congratulations to Drs. Andre Geim and Konstantin Novoselov, scientists at the University of Manchester in England who were just awarded the 2010 Nobel Prize in Physics for their research on graphene, a single-atom-thick form of carbon with outstanding physical, electrical, and chemical properties.</description>
<dc:rights></dc:rights>
<dc:date>2010-10-08T09:00+00:00</dc:date>
</item>


<item rdf:about="http://www.keithley.com/news/prod031010">
<title>Keithley Publishes Digital Multimeter Technical Library on CD</title>
<link>http://www.keithley.com/news/prod031010</link>
<description>Cleveland, Ohio - March 10, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, has published a digital multimeter (DMM) technical library for engineers and researchers who use DMMs for a wide range of applications. </description>
<dc:rights></dc:rights>
<dc:date>2010-03-10T09:00+00:00</dc:date>
</item>


</rdf:RDF>




