Home / products / DC/AC Instruments & Systems / Source Measure Units (SMUs) / 20W to 100W System Source Measurement Unit (SMU) Instruments

 

Simplify Your Solar Cell Testing with Keithley's Precision Measurement Solutions

Model 2602A Dual-channel System SourceMeter Instrument (3A DC, 10A Pulse)

Part Number : 2602A

Model 2602A Dual-channel System SourceMeter Instrument (3A DC, 10A Pulse)

Model 2602A Dual-channel System SourceMeter Instrument (3A DC, 10A Pulse)

Model 2602A Dual-channel System SourceMeter Instrument (3A DC, 10A Pulse)

The Series 2600A System SourceMeter instruments are being replaced with the Series 2600B System SourceMeter SMU instruments - the most powerful, fastest, and highest resolution SMU instrument in the industry.

Series 2600A System SourceMeter instruments are suitable as either bench-top I-V characterization tools or as building block components of multi-channel I-V test systems. For bench-top use, Series 2600A instruments feature an embedded TSP Express Software Tool that allows users to quickly and easily perform common I-V tests without programming or installing software. For system level applications, the Series 2600A's Test Script Processor (TSP) architecture, along with other new capabilities such as parallel test execution and precision timing, provides the highest throughput in the industry, lowering the cost of test. To simplify the testing, verification, and analysis of semiconductor components, the optional ACS Basic Edition software is also available.

keithley web forum
Bookmark and Share

  • Combines a power supply, true current source, 6-1/2 digit DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller – all in one instrument
  • Family of products offers wide dynamic range: 1fA to 50A and 1μV to 200V
  • 20,000 rdg/s provides faster test times and ability to capture transient device behavior
  • Precision timing and channel synchronization (<500ns)
  • USB port for saving data and test scripts
  • LXI Class C compliance supports high speed data transfer and enables quick and easy remote testing, monitoring, and troubleshooting
  • Software:
    • TSP® Express for quick and easy I-V test (embedded)
    • ACS Basic Edition for semiconductor component characterization (optional)


 
PRODUCT SEARCH
To search for products, please enter the
keyword(s) and click Go: