| Current Voltage (I-V) Sourcing and Measurement (SMU) |
| Multi-Channel I-V Test Solutions Series 2600A with embedded Test Script Processors and TSP® Express Software | Sub-Femtoamp |
Source Measure Unit (SMU) |
Multi-Channel I-V Characterization (Parameter Analyzer) |
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4200-SCS C-V Option Pulse IV option Pulse IV w/ Q Point 2 Ch Pulse Gen 2 Ch Oscilloscope FLASH memory test |
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| Model |
2602A (Dual Ch) 2601A (Single Ch) |
2612A(Dual Ch) 2611A(Single Ch) |
2636A(Dual Ch) 2635A(Single Ch) |
6430 | 237 | 4200-SCS | |
| Description | Scalable, High Throughput |
High voltage and pulsed output |
Low current and pulsed output |
Ultra-Low Current | Low current, 1100V | Multi-Channel I-V Characterization | |
| Programming | IEEE-488, RS-232 communication with embedded Test Script Processor (TSP) capability and LXI Class C Compliance | IEEE-488, RS-232 | IEEE-488 | Embedded GUI | |||
| Software for Instrument-Based Systems (ACS Systems Family of Products) | ||
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| Model | ACS Basic Edition | Automated Characterization Suite (ACS) Test Systems |
| Description | Component test, verification, and analysis applications | Advanced reliability (WLR) testing, multi-site parallel wafer/die sort, SMU-per-in WLR testing, and automated device characterization |
| I-V Test Solutions - Series 2400 SourceMeter Instruments | ||||||
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| Model | 2400 | 2410 | 2420 | 2425 | 2430 | 2440 |
| Description | General Purpose | High Voltage | 3 A | High Power | Pulse | 5 A |
| Programming | IEEE-488, RS-232 | |||||
| Contact Check and Other |
2400-C 2400-LV | 2410-C | 2420-C | 2425-C | 2430-C | 2440-C |