Model 2430 1kW Pulse Mode SourceMeter w/ Measurements up to 100V and 10A
- Specification
- Models 2430 and 2430-C SourceMeter Specifications Rev. C
- Models 2400, 2401, 2400-LV and 2400-C SourceMeter Specifications
- Manual
- Model 2430 1kW Pulse SourceMeter Service Manual Rev. B
- Series 2400 SourceMeter User's Manual
- Model 2400 SourceMeter Service Manual Rev. D
- Model 2400 Series SourceMeter Japanese User's Manual Rev. A (12.2MB)
- 2400 Series SourceMeter Quick Start Guide
- FAQ
- Do I need to send the INIT command to trigger the Model 2430 when using Pulse Mode?
- Is it Possible to Combine Sweep Operation with Pulse Mode on the Model 2430?
- Why does my 2430 fail to Source High Energy Pulses using the 10A Range?
- Specs: Voltage Burden Specification of SourceMeter Explained
- Remote Operation: Why do I get a VISA timeout (BFFF0015) using RS-232 with a SourceMeter?
- Amps: Which current source do you recommend to use with the Model 2182 Nanovoltmeter?
- Ohms: Which products are recommended for measuring in the range of 2 - 50 micro-ohms?
- Remote Operation: How can I program a SourceMeter Instrument to Measure Resistance?
- Remote Operation: What Front Panel Settings are Required to use the VXIPnP drivers for SourceMeter?
- Ohms: How can I measure electron mobility of a thin film?
- Speed: What factors affect the speed of a SourceMeter?
- Speed: How fast can the 2400 series output a pulse?
- Ohms: What is AUTO or MANUAL mode when measuring Resistance with a 2400?
- Feature: What is the Contact Check option of a Source Meter?
- Compliance: Can the measurement range be different than the compliance range?
- Compliance: What does it mean when the units for the compliance value blink on the front panel?
- Compliance: What does it mean when the CMPL (compliance) blinks on the front panel?
- Compliance: How do I change the compliance (CMPL) value?
- Ohms: Which SourceMeter instrument do you recommend for four-point probe measurement techniques?
- Amps: What is the Output Resistance for the Current Source of a SourceMeter?
- Application Examples for SourceMeter Instruments
- Amps: When using a SourceMeter to measure only (no sourcing), why is the current negative?
- Sweep: Is it possible to send a command to the SourceMeter that will interrupt the sweep?
- Sweep: Can I use an external trigger to stop a SourceMeter sweep?
- Compliance: What is Compliance Voltage on the Source-Measure Units and SourceMeter instruments?
- Remote Operation: What are VXIPnP Drivers?
- Remote Operation: Can I use GPIB cards from Agilent with Keithley's Instrument Drivers?
- Specs: What is Offset Compensation?
- Feature: What are the differences between a 236 and a 2400 type product?
- Speed: What would be a good instrument to use to measure di/dt?
- Ohms: How do you decide whether to use a two-probe method or a four-probe method for resistance?
- Specs: What is CMRR (Common Mode Rejection Ratio)?
- Troubleshooting: How do I limit ground loops?
- Specs: What are the effects on accuracy due to possible deterioration within calibration periods?
- Remote Operation: What VISA Resource Name is required when using the KPCMCIA-GPIB card (Ines)?
- Speed: What is NPLC?
- Specs: How Can I Apply an Accuracy Specification on a Data Sheet to my Specific Measurement?
- Application Note
- #2154 Testing Devices with High Voltage and High Current
- #2124 Production Testing of High Current Varistors with the 2430C 1kW Pulse SourceMeter
- Word 6.0 File Discussing the Issues of Ohms Accuracy with the 2400 Series
- Technical Note for SourceMeter Buffers and How to Get Up to 5000 Data Points Using the Two Buffers
- 2400 Series Timestamping Technical Note
- Device Characterization Techniques Using Keithley SourceMeter Instruments with LabTracer Software
- Determining output resistance for the 2400 Series SourceMeter
- #2217 Trigger Synchronization of Multiple SourceMeter Instruments
- DC Electrical Characterization of RF Power Transistors
- 2218 Production Testing of High-Intensity Visible LEDs
- #2208 Solutions for Production Testing of Connectors
- #2616 Converting a Series 2400 SourceMeter SCPI Application to a Series 2600 System SourceMeter Script Application
- How to Choose and Apply Source Measure Unit SMU Instruments
- Methods to Achieve Higher Currents from I-V Measurement Equipment
- Electrical Characterization of Photovoltaic Materials and Solar Cells with the Model 4200-SCS Semiconductor Characterization System
- Article
- Increasing RF Device Test Throughput with Better Instrument Coordination
- From Lab to Fab ? Get the Testing Right
- Better Solar Cell Testing: The Key to Faster Development and Production
- Combining the Benefits of LXI and Scripting
- Using Forward Voltage to Measure Semiconductor Junction Temperature
- White Paper
- Telecom Test Equipment Must Meet Tight Space Demands While Providing High Throughput, Accuracy
- Obtaining More Accurate Resistance Measurements Using the 6-Wire Ohms Measurement Technique
- New Test Realities for Evolving FPD Technologies
- Rapidly Expanding Array of Test Applications Continues to Drive Source Measurement Unit Instrument Technology (also Applicable to Series 2600B)
- Choosing the Optimal Source Measurement Unit Instrument for Your Test and Measurement Application (also Applicable to Series 2600B)
- Data Sheet
- Series 2400 SourceMeter Line
- Technical Information - Source Measurement Unit (SMU) Instruments
- 2013 Bench Products Test and Measurement Solutions
- Brochure
- Series 2400 SourceMeter Family
- Source Measure Unit Instruments - The Tool of Choice for Emerging R&D Applications
- Discover the Industry Standard for LED Electrical Test
- Electrical Measurement of High Brightness LED Electrical E-Guide
- E-Guide to Solving Today's Material and Device Characterization Challenges
- Advances in Electrical Measurements for Nanotechnology E-Handbook
- Simplify Your Solar Cell Testing with Keithley's Precision Measurement Solutions
- Discover Today's Solutions for Tomorrow's Nano Characterization Challenges
- Keithley Pulse Solutions
- E-Guide: Re-Inventing High Power Semiconductor and Device Characterization
- E-Handbook to Understanding Electrical Test and Measurement
- Selector Guide
- Source and Measure Products Selector Guide
- Function/Pulse/Arbitrary Pattern Generators Selector Guide
- Handbook
- Advances in Electrical Measurements for Nanotechnology
- E-Guide to Solving Today's Material and Device Characterization Challenges