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Semiconductor Characterization Software

Our Automated Characterization Suite (ACS) software offers powerful solutions for automating semiconductor characterization at the device, wafer, or cassette level. ACS Integrated Test Systems fill the gap between interactive lab-based tools and high-speed production test tools. ACS Basic Edition is optimized for bench-top parametric testing of component and discrete (packaged) semiconductor devices, maximizing the productivity of technicians and engineers in R&D. ACS-WLR (Wafer Level Reliability) Integrated Test Systems allow the creation of lifetime predictions from two to five times faster than do conventional WLR test solutions, accelerating technology development, process integration, and process monitoring for faster time to market.
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ACS

Automated Characterization Suite (ACS) Software
  • Supports a wide array of instruments and probers
  • Intuitive GUI simplifies I-V tests, analysis and results from bench-top to fully automated parametric testers
  • Develop and execute tests at the device, site, wafer and
  • cassette level
  • Intuitive GUI for test plan development and interactive
  • operation
  • Interactive and real-time data plotting

ACS Basic Edition

Model ACS Basic Edition for Component Characterization
  • Semiconductor component characterization
  • Failure analysis
  • Easily adapted to new technology applications
  • Library of hundreds of standard device tests
  • Supports full range of Keithley SourceMeter instruments and more

Wafer Level Reliability Option

Model ACS-2600-RTM Wafer Level Reliability Option to ACS
  • Interactive interface optimized for parallel SMU-per-pin testing
  • Compliant with most JEDEC standard test methods
  • Powerful and flexible stress/measure sequencing capability
  • Formulator for parameter analysis and line fits
  • Monitor real-time test results
 
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