Automated Characterization Suite (ACS) Software
All-in-one solution: from test setup to analyzing results
Intuitive GUI simplifies test plan development,
test execution, and results analysis- Develop and execute tests at the device, site,
wafer, and cassette level - Supports a wide range of instruments and system
configurations including multi-SMU parallel
test systems - Full control of semi-automatic and fully-automatic
probers - Interactive and real-time data plotting
ACS is a flexible, interactive software test environment designed for semiconductor device characterization, reliability test, parametric test, and component functional test. ACS supports a wide range of Keithley instrumentation, as well as Keithley's S500 and S530 systems. Exceptional testing and analysis flexibility and an intuitive GUI make novice users productive almost immediately.