Device Characterization Systems and Semiconductor Parameter Analyzers
Document Actions
- Products
- Automated Characterization Suite (ACS) Test Systems
- Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
- Model 4200-CVU Integrated C-V Option for the Model 4200-SCS
- Model 4200-CVU-UPGRADE 4200-CVU Card and Upgrade for Existing 4200-SCS Systems
- Model 4205-PG2 Dual-Channel Pulse Generator
- Model 4200-SCP2 Dual-Channel Oscilloscope Card
- Model 4200-SCP2HR 200MS Dual-Channel Oscilloscope Card
- Model 4200-PIV-A Pulse I-V Option for the Model 4200-SCS (includes Models 4200-PG2 and 4200-SCP2, Software, and Specialized Interconnect Hardware)
- Model 4200-PIV-Q Pulse I-V with Q Point and Dual Channel Pulsing
- Model 4200-FLASH Non-Volatile Memory Test Option