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Home / products / Semiconductor Test Systems and Software / Parametric Analyzers

Parametric Analyzers

The most versatile analyzers for electrical characterization of materials, devices and processes

Keithley’s parameter analyzers are high performance, flexible systems that perform comprehensive electrical characterization of semiconductor devices, materials and processes.

From basic I-V and C-V measurement sweeps to advanced ultra-fast pulse I-V, waveform generation & capture and transient I-V measurements, Keithley’s parameter analyzers are poised to handle your present and future test requirements.

4200-SCS Semiconductor Parameter Analyzer

4200 Semiconductor Characterization Systems

Intuitive Windows based user interface

Single instrument solution

I-V, C-V and pulse generation, and pulse I-V

Application libraries included for every technology

High Power Curve Tracer Solutions

Parametric Curve Tracer Configurations

3 kV/100A high power characterization

Full range of C-V capability

Low start-up cost and expandable when funding allows

Reconfigure your test system as requirements change

Comprehensive software to easily characterize power devices

User-modifiable application tests makes it easy to make complicated measurements

Bundled Solutions for Parametric Analysis

Model 4200-SCS-PK2 High Resolution IV & CV Bundled Characterization Solution

Outstanding performance combined with the savings of a bundled solution

Full range of I-V & C-V measurement sweeps

Low start-up cost and expandable when funding allows

Jump start your testing with over 450 user-modifiable application test programs

Prober and temperature controller drivers

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