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Semiconductor Test Systems and Software
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Semiconductor Parametric Test Systems
Semiconductor Parametric Test Systems
S530 Basic
Industry’s most cost-effective fully automatic parametric tester
Compatible with popular fully automatic probers
Cabled-out configuration maximizes prober interface flexibility
Supports 5-inch probe card libraries
Proven instrumentation technology ensures high measurement accuracy and repeatability
S530 Low Current
pA current measurement capability
Low leakage measurement integrity
20W SMUs provide up to 1A or 200V
Configurable up to 8 SMUs and 60 pins
Optional adapter extends guarding to probe
Compatible with popular fully automatic probers
C-V measurements up to 1MHz
S530 High Voltage
Source up to 1000V at 10mA
High voltage leakage and breakdown testing
Low leakage measurement integrity
pA current measurement capability
20W SMUs provide up to 1A or 200V
Configurable up to 7 SMUs and 32 pins
Optional adapter extends guarding to probe
Compatible with popular fully automatic probers
C-V measurements up to 1MHz
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CALL NUMBER
1-800-935-5595 (US Only)