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Series S530 Parametric Test Systems
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Precise high speed measurements with automated probe stations
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| Part Number
: S530 |
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S530 Parametric Test Systems are designed for production and lab environments that must handle a broad range of devices and technologies, offering industry-leading test plan flexibility, automation, probe station integration, and test data management capabilities. Keithley has brought more than 30 years of expertise in delivering a wide range of standard and custom parametric testers to customers around the world to the design of these test solutions. |
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- Readily adaptable to new devices and test requirements
- Fast, flexible, interactive test plan development
- Compatible with popular fully automatic probe stations
- Options for 1kV, C-V, pulse generation, frequency measurements, and low-voltage measurements
- Compatible with Keithley's Model 9139A Probe Card Adapter
- Supports reuse of existing five-inch probe card libraries
- Proven instrumentation technology ensures high measurement accuracy and repeatability in both the lab and the fab
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