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| Model 2612A Dual-channel System SourceMeter Instrument (200V, 10A Pulse) |
| Part Number
: 2612A |
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Series 2600A System SourceMeter® instruments are Keithley's latest I-V source-measure instruments for use as either a bench-top I-V characterization tool or as a building block component of multi-channel I-V test systems. For bench-top use, Series 2600A instruments feature an embedded TSP® Express Software Tool that allows users to quickly and easily perform common I-V tests without programming or installing software. For system level applications, Series 2600A's Test Script Processor (TSP®) architecture along with new capabilities such as parallel test execution and precision timing provides the highest throughput in the industry to lower the cost of test. Series 2600A System SourceMeter instruments replace the popular Series 2600 System SourceMeter instruments with a superset of features. The Series 2600A provides backward code compatibility to the Series 2600, so customers can drop-in replace Series 2600 with Series 2600A. |
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- Combines a power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller - all in one instrument
- Backward code compatible to Series 2600 System SourceMeter® Instruments for drop-in replacement
- TSP® Express software tool for Quick and Easy I-V Test
- Precision timing and channel synchronization (<500ns)
- Parallel test execution for unmatched throughput
- 20,000 rdg/s provides faster test times and ability to capture transient device behavior
- Family of products offers wide dynamic range: 1fA to 10A and 1µV to 200V
- TSP-Link® bus allows up to 32 units/64 channels of channel expansion per GPIB or IP address
- Test Script Processor (TSP®) runs complete test programs (scripts) in the instrument for unparalleled system automation
- USB port for saving data and test scripts
- LXI Class C compliance provides high speed data transfer and enables quick, easy remote testing, monitoring, and troubleshooting
Product Intro
Product Tour
Product Demo
- I-V functional test and characterization of a wide range of devices, including:
- Discrete and passive components
- Two-leaded - Sensors, disk drive heads, metal oxide varistors (MOVs), diodes, zener diodes, sensors, capacitors, thermistors
- Three-leaded - Small signal bipolar junction transistors (BJTs), field-effect transistors (FETs), and more
- Simple ICs - Optos, drivers, switches, sensors
- Integrated devices - Small Scale Integrated (SSI) and Large Scale Integrated (LSI)
- Analog ICs
- Radio frequency integrated circuits (RFICs)
- Application specific integrated circuits (ASICs)
- System on a chip (SOC) devices
- Optoelectronic devices such as light-emitting diodes (LEDs), laser diodes, high brightness LEDs (HBLEDs), vertical cavity surface-emitting lasers (VCSELs), displays
- Wafer level reliability
- NBTI, TDDB, HCI, Electromigration
- Solar Cells
- Batteries
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CALL NUMBER
1-800-935-5595 (US Only)
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