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Keithley University 2012-TECH BRIEFS- nwe for 2012!- Three tracks. Expanded course offerings. Still FREE. Sign up now.

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We've gathered a series of tutorial webcasts that cover best practices for making even the most demanding measurements.

Complete the form below and receive continued access to all of these informative webinars. Click here.

Hear a webcast review from Richard Comerford,
Electronic Products. Click here
  • Electrical Measurement Fundamentals Track

  • Understanding the Basics of Measurement

  • Many people need to make electrical measurements but are not necessarily experts in measurement science. In this seminar, scientists or engineers who need to perform electrical measurements but who have little experience can learn how to go about choosing test equipment, designing a test system, or simply carrying out measurements using existing equipment.
  • What Is an SMU Instrument, and How Do You Decide Which One Is Right for Your Application?

  • The popularity of these SMU instruments has increased rapidly as more people discover that their tightly-integrated DMM and precision power supply capabilities can serve a wide variety of applications throughout the electronics and semiconductor industries. Learn how to evaluate instrument specifications carefully in order to choose the most appropriate SMU for a specific application.
  • How to Get the Most from Your Low Current Measurement Instruments

  • This seminar covers the basics of low current (from nanoamps to femtoamps) electrical measurements, including how to select the right current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of error. These measurement best practices are important for applications in semiconductor material/device characterization, nanoscience test and measurement, optoelectronic device characterization, and many more. Examples of applications where such sensitive measurements are required will be discussed, together with an overview of recent test equipment innovations.
  • Learn the Fundamentals of Hall Effect Measurements

  • When you attend this seminar, you will learn how Hall Effect measurement systems are commonly used to determine semiconductor parameters, such as carrier mobility and carrier concentration, Hall coefficient, and conductivity and conductivity type.
  • How to Make Electrical Resistivity Measurements of Bulk Materials: Conductors, Insulators, and Semiconductors

  • Learn how to overcome the challenges associated with making resistivity measurements of bulk materials, whether conductor, insulator, or semiconductor. You will learn specific measurement methods, including four-wire resistance, surface resistivity, and four-point collinear probe and van der Pauw measurements. In addition, you will learn measurements techniques and sources of error, including electrostatic interference and shielding, leakage current and guarding, thermoelectric EMFs and offset compensation, and others.
  • Advanced Electrical Measurements Track

  • Understanding Electrical Characterization of Printed and Organic Electronics and Materials

  • Learn how to make accurate measurements on printed and organic electronics and materials by reducing various sources of measurement errors. This seminar presents methods and best measurement practices together with application examples.
  • Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing

  • This seminar is designed to help laboratory engineers implement, troubleshoot, and verify C-V measurement systems. The seminar will discuss the keys to getting good C-V measurement results. Topics to be discussed include system setup and results from some extended C-V applications, such as high voltage C-V and quasistatic C-V.
  • Learn Tips, Tricks, and Traps in Ultra-Fast I-V Semiconductor Characterization

  • Learn how to implement, troubleshoot, and verify pulsed I-V, transient I-V, and general-purpose Ultra-Fast I-V measurement systems. The seminar will provide the keys to getting good measurements. Topics discussed include system setup, typical measurement limitations, and results from some actual devices.
  • Mastering Low Power, Low Voltage, Low Resistance Measurement Techniques for Characterizing Graphene and Other Nano Materials

  • Learn how to make low current measurements and low resistance measurements on materials such as Graphene, which must be characterized at very low power levels. This seminar presents methods and best measurement practices in order to optimize the quality of measurements.
  • Device Specific Measurements Track

  • Understanding Electrical Characterization of Solar Cells

  • Learn about the different measurement techniques that can be used to electrically characterize solar cells. By attending our seminar, you will learn how to measure short-circuit current (Isc), open circuit voltage (Voc), maximum power output (Pmax), and conversion efficiency, as well as select the correct instrumentation and best practices for connecting to the solar device.
  • How to Measure the Newest Non-Volatile Memory Technologies

  • Learn characterization and measurement techniques for various alternate non-volatile memory (NVM) technologies, including FLASH, PRAM, ReRAM, and FeRAM. By attending our seminar, you will learn characterization methods, such as transient switching behavior, endurance, and the need for dynamic current measurement, common to these various NVM memory technologies. You will also see examples of how pulse source and measurement using a single instrument can measure the current and voltage simultaneously while applying multi-pulse waveforms to a memory device or material.
  • Meeting the Electrical Measurement Demands of High Power, High Brightness LEDs

  • Learn how to properly test today's High Power, High Brightness LEDs. This seminar covers the testing of large die LEDs and LED modules, the resulting requirement for greater current capacity and greater output waveform flexibility from the test equipment used, as well as the proper cabling requirements.
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