WS/077: Reducing Test Time with Distributed Programming in
PXI, LXI, TSP™, and GPIB Hybrid Systems
This seminar introduces the concepts of distributed processing and concurrent execution and illustrates the benefits they provide in both overall test time and test system development costs. The seminar offers insight into the advantages of developing hybrid test systems with multiple instrument interfaces, including TSP, GPIB, LXI, and PXI. Each interface has advantages in some applications within a test system; dramatic speed improvements can be realized by optimizing the use of each interface.

By participating in this seminar, you will learn and understand:
  • The advantages of utilizing distributed programming and concurrent execution in the test system.
  • The features and advantages of each instrument interface.
  • How to design a hybrid test system based on the needs of your application.
  • Examples demonstrating the capabilities of Keithley’s hybrid system solutions.

This seminar is recommended for production test engineers and system integrators designing advanced test systems as well as anyone researching the instrument interfaces to use in their application.

Speaker: Chris Armstrong, Associate Marketer

Chris Armstrong is an Associate Marketer for PXI products at Keithley Instruments, Inc. in Cleveland, Ohio. He joined Keithley Instruments in 2000 as an applications engineer and has conducted low level measurement seminars worldwide.


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