Original Broadcast Date: June 26, 2008
This seminar follows up on the material presented in the
Semiconductor C-V Testing Fundamentals seminar.
It is designed to help laboratory engineers implement, troubleshoot, and verify C-V measurement systems. The seminar will discuss the keys to getting good C-V measurement results. Topics to be discussed include system setup and results from some extended C-V applications, such as high voltage C-V and quasistatic C-V.
Participant Objectives:
By participating in this seminar, you will learn and understand:
- Connecting a C-V instrument to a probe station properly
- Common cable correction techniques
- Performance verification at the probe tips
- Identifying and troubleshooting typical C-V errors
- Implementing extended C-V applications, such as high voltage and quasistatic C-V
Target Audience:
Anyone who performs C-V measurements as part of his or her job would benefit from this seminar, as would students, technicians, engineers, and lab managers who are responsible for installing and maintaining C-V equipment and probe stations.
About the Presenter:
Lee Stauffer is a Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group, based in Cleveland, Ohio. Prior to joining Keithley, his career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.
