Keithley Instruments Inc. - WS/114: Semiconductor Capacitance-Voltage (C-V) Testing Fundamentals

WS/114: Semiconductor Capacitance-Voltage (C-V) Testing Fundamentals

This seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. C-V testing is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime.

Participant Objectives
Those participating in this seminar will learn:

What is C-V testing?
For what types of devices can C-V testing be used to characterize?
Who can use C-V?
C-V measurement challenges.

Target Audience:
Engineers new to semiconductor materials and device testing, process and device engineers who would like to refresh their knowledge of this testing methodology, characterization lab managers.

About the Presenter:
Lee Stauffer is Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group, based in Cleveland, Ohio. Prior to joining Keithley, his career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.

I'd like to register for Semiconductor Capacitance-Voltage Testing Fundamentals.

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