WS/141: Practical Tips and Tricks for Avoiding Common Pitfalls when Implementing Parallel Test Production test engineers often look to parallel test as a solution when test capacity needs increase. However, throughput gains can be sub-optimal without giving proper consideration to identification of throughput limiters, test structure interdependencies, and data management. This seminar is designed to offer sound guidance for migrating from sequential test to parallel test. We'll explore ways to maximize resource utilization, efficiently balance system controller duties, and manage control of test timing and sequencing.

Those participating in this seminar will learn:
  • How to optimize existing test resources to increase throughput
  • How to determine where to add test resources in order to maximize throughput gains
  • Alternatives to a traditional single system controller to eliminate bottleneck in data management and resource configuration
  • How to use triggering to achieve critical test sequence timing
  • Selection criteria for test resources that maximize parallel test investment
This seminar is recommended for test engineers and test engineering managers who are contemplating a move to parallel test. The content is appropriate for engineers working with on-wafer and/or packaged devices.

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