WS/145: Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing

This seminar is a follow-up to the material presented in the Semiconductor C-V Testing Fundamentals seminar. It is designed to help laboratory engineers implement, troubleshoot, and verify C-V measurement systems. The seminar will discuss the keys to getting good C-V measurement results. Topics to be discussed include system setup and results from some extended C-V applications, such as high voltage C-V and quasistatic C-V.

Those participating in this seminar will learn:
  • • How to properly connect a C-V instrument to a probe station
  • • Common cable correction techniques
  • • Performance verification at the probe tips
  • • Performance verification at the probe tips
  • • How to implement extended C-V applications, such as high voltage and quasistatic C-V
This seminar is intended for those whose job requires performing C-V measurements. Students, technicians, engineers, and lab managers who are responsible for installing and maintaining C-V equipment and probe stations will also benefit from this seminar.

About the Presenter
Lee Stauffer is Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group, based in Cleveland, Ohio. Prior to joining Keithley, his career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.


  Area Number(No hyphen) Ext
  Area Number(No hyphen)


Password(Optional)
To get easy access to Keithley's many technical resources, please create a password below. This will eliminate the need for you to repeatedly provide your contact information.
               


Already have a password?
Forgot password?