Keithley Instruments Inc. - WS/147: New Methods for Testing Flash Memory

WS/147: New Methods for Testing Flash Memory During this webinar, fundamentals of Flash technology testing will be reviewed, incorporating a discussion of FN (Fowler-Nordheim) and (HEI) (Hot Electron Injection) programming and erasing. Different aspects of testing applicable to single Flash transistors and Flash array testing will be considered, including standard transistor characterization, endurance, and disturb testing. The pulse fidelity requirement for MLC testing will also be discussed. These applications will be demonstrated via Keithley's new Ultra Fast I-V test solution, which offers better control of the pulse shape and amplitude, and, as a result, is well-suited for MLC Flash testing, and also Keithley's ACS software, which manages a range of testing scenarios.

Target Audience
This webinar will be beneficial for people with established Flash test setups, as well as those looking for a test solution.

About the Presenter
Alex Pronin is currently a lead applications engineer with Keithley Instruments, Inc. in Cleveland, Ohio and has been with the company since 1996. Alex holds a Master’s Degree in Physics from the Moscow Institute of Physics and Technology and a Ph.D. in Material Science from Dartmouth.

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