Keithley Instruments Inc. - WS/079: Increasing Functional Test Throughput Using Distributed Processing Techniques

WS/079: Increasing Functional Test Throughput Using
Distributed Processing Techniques

A method will be described for addressing the continual need to decrease cost of functional test and increase test floor throughput. An existing on-wafer test sequence will be described; how avenues for throughput gain were identified for a homegrown functional test rack; new enabling measurement technologies available; and implementation and migration details and resulting operational benefits.

Target Audience:
This seminar is recommended for production test engineers, test managers, and system integrators who design and implement production test systems that incorporate DC Current-Voltage (I-V) measurements.

Speaker: Steve Weinzierl, Applications Engineering Manager Keithley Instruments
Steven Weinzierl is the Applications Engineering Manager at Keithley. He has a Ph.D. from Cornell University, and over 15 years of semiconductor industry experience. Steve has over 30 refereed journal and conference publications and 1 patent.

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