These seminars were a part of Nano Days held in April 2007 that included various Keithley partner companies presenting on the topic of nanotechnology. This seminar includes 2 presentations, each being approximately 30 minutes in length.
Presentation 1: Advanced particle beam methods for nano-characterization and analysis
ABSTRACT
Every historic era has had its material building blocks from which visionaries and pioneers pursued new ideas and concepts by understanding the relationship between the properties and required functions of materials. Today, nanotechnology is ultimately linking properties and functions by understanding, manipulating, and shaping microstructures down to the atomic level. Nanotechnology is changing material design rules from empirical-based approaches into knowledge-based problem-solving.
As business opportunities in the nano economy go hand in hand with knowledge creation, tools are required to deliver high content visualizations and, for example, reliable and fast electrical or chemical information. Long before the nanotechnology era was widely acknowledged, FEI tools have been used extensively for characterizing, analyzing and measuring or prototyping structures at the nanoscale level (with at least one dimension of less than 100 nm) and down to the angstrom or atomic level.
This presentation shows case studies on how nanotechnology is progressing from the industrial research environment into product design and development. The capabilities of some new nano-imaging and prototyping tools are also discussed.
In addition, global trends and value drivers of nanotechnologies in research and industry are discussed.
SPEAKER BIO
Jens Greiser manages the Strategic Marketing of FEI Company, focusing on nano research and industry. He is based in The Netherlands and his responsibilities cover the analysis of emerging business opportunities in nano-driven industrial markets, as well as shaping long-term roadmaps. He has more than 10 years experience in the nanotechnology instrument equipment market in a variety of roles. Greiser graduated in Solid State Physics (Dipl.-Phys.) and received his PhD in Materials Sciences in 1999 from the Chemistry department of the University of Stuttgart. His PhD work was related to thin film technology and novel characterization methods at the nanoscale level. The work was done at the Max Planck Institute for Metals Research in Stuttgart.
COMPANY INFORMATION
FEI Europe Main Office
Europe Nanoport
Achtseweg Noord 5, Bldg Aae
5651 Gg Eindhoven
The Netherlands
Phone: +31 40 23 56000
Fax: +31 40 23 56612
Sales: +31 40 23 56504
Customer Service: +31 40 23 56924
Web: www.fei.com
FEI is a global leader in providing innovative instruments for nanoscale imaging, analysis, and prototyping. FEI focuses on delivering solutions that provide groundbreaking results and accelerate research, development, and manufacturing cycles for its customers in the Semiconductor and Data Storage, Academic and Industrial R&D;, and Life Sciences markets. With R&D; centers in North America, Europe, and India, and sales and service operations in more than 50 countries around the world, FEI's Tools for NanotechTM are bringing the nanoscale within the grasp of leading researchers and manufacturers.
Presentation 2: In-situ Correlation of Mechanical Properties, Deformation Behavior, and Electrical Characteristics of Materials Using Conductive Nanoindentation
ABSTRACT
Nanomechanical testing techniques have become a popular method for quantitative, small volume mechanical property determination. Conceptually, nanoindentation is a relatively straightforward technique where an indenter probe of a well-known geometry is pushed into and withdrawn from the material’s surface while the force and displacement are continuously recorded to a high degree of accuracy and sensitivity. A new nanomechanical characterization technique, generally referred to as conductive nanoindentation, combines nanoindenter hardware with a conductive probe and a voltage/current SourceMeter® instrument to get a time- based correlation of force, displacement, voltage, and current. The nanomechanical and electrical measurements used in tandem have proven to be highly sensitive to probe/sample contact conditions, as well as material deformation behavior. This technique greatly enhances the information obtainable from nanoscale point measurements. This presentation will cover the basic conductive nanoindentation technique, along with intriguing results obtained from relatively mature materials, such as gold, silicon, and metallic glasses to more advanced materials, such as conductive polymers and conductive metal oxides (ITO).
SPEAKER BIO
Ryan C. Major, Ph.D., is a Senior Staff Scientist at Hysitron, Inc. He received his PhD in Materials Chemistry in 2003 from theUniversity of Minnesota. His graduate research involved studying the physical and chemical properties of organic thin films. Following graduate school, he was a Post-Doctoral Associate in a joint program between Sandia National Labs-Albuquerque, New Mexico, and the University of Minnesota. He constructed an Interfacial Force Microscopy (IFM) laboratory to quantitatively study the complex interfacial forces that dominate between nano-confined surfaces. In 2005, Ryan joined Hysitron, Inc. and has continued to study the nature of materials and surface properties at the nanoscale. He is currently the lead technical developer for Hysitron’s conductive-nanoindentation platform, NanoECR™.
COMPANY INFORMATION
Hysitron, Inc.
10025 Valley View Road
Minneapolis, MN 55344 USA
Tel: +1 952-835-6366
Fax: +1 952-835-6166
Email: info@hysitron.com
Web: www.hysitron.com
Hysitron was founded in 1992 as a research facility committed to the development of three-axis positioning transducer technology. Out of this has grown a new level of performance in mechanical property testing at nanoscale, with other new instruments based on this technology still in research.
