These seminars were a part of Nano Days held in April 2007 that included various Keithley partner companies presenting on the topic of nanotechnology. This seminar includes 2 presentations, each being approximately 30 minutes in length.
Presentation 1: How to Avoid Self-Heating Effects on Nanoscale Devices
ABSTRACT
Nanoelectronics is a rapidly developing field with potential impact across a wide range of industries. Devices such as carbon nanotubes, semiconductor nanowires, graphene-based electronics, molecular organic-based electronics, and single electron devices are routinely researched and characterized today. Characterizing the electrical properties of these delicate nanoelectronic components and materials requires instrumentation and measurement techniques optimized for low power measurements. Low temperature materials, nanodevices, and sub-micron silicon structures can be easily be altered or even destroyed by the heat generated from excessive power sourced by the instrumentation that is used to measure resistance (R) and I-V characteristics. Traditional DC techniques are also not adequate to reveal how devices really operate. Consequently, different testing techniques are needed for the new era of nanoelectronic devices.
One such technique is known as pulsed testing. Pulsed electrical testing is a measurement technique that reduces the total energy dissipated in a device, and thus the potential for damage. The device under test (DUT) is excited for a very short interval with a source high enough to produce a quality measurable signal and then the source is removed. This type of pulsed testing is essential for the next generation of “beyond CMOS” nanoelectronic devices. This presentation will review pulse testing techniques and equipment to solve these measurement challenges.
SPEAKER BIO
Jonathan Tucker is the Lead Marketing Engineer for Nanotechnology, Research and Education and the Sensitive Measurements Product Line Manager at Keithley Instruments in Cleveland, Ohio. He joined Keithley Instruments in 1987 and has held numerous positions, including Test Engineer, Applications Engineer, Applications Manager, and Product Marketer. His current focus is business strategy and product development of electrical characterization and measurement tools for nanotechnology applications.
Jonathan is the Co-Chair of the IEEE Nanoelectronics Standards Roadmap effort, dedicated to the development of standards to aid in the commercialization of nano-scaled electronics. He also supported and co-authored the release of IEEE 1650TM-2005, IEEE Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes, the world’s first nanotechnology measurement standard. Jonathan is a member of the Board of Advisors for the Cleveland Nano-Network. He holds a Bachelor of Electrical Engineering degree from Cleveland State University and an MBA from Kent State University.
Presentation 2: Give Your Microscope a Hand: Characterization of Nano Structures
ABSTRACT
Nowadays, Scanning Electron Microscopes (SEM) and Focused Ion Beam Systems (FIB) are optimized for their imaging and analytical capabilities. In-situ manipulation allows the preparation and characterization of specific nano-structures, such as electronic structures, nanowires, and nanotubes.
The presentation will introduce the basic manipulation technology, consisting of a single or multiple micro-manipulators, which can be equipped with different plug-in tools, such as a tip, gripper, four-point probe, LCMK (low current measurement kit), micro-injection, force measurement system, etc
Each plug-in tool provides the user with a capability, such as manipulation of small structures, electrical characterization by probing, mechanical characterization, etc. These capabilities will be presented, followed by a number of specific applications where certain capabilities are used to solve scientific questions.
The objective of the presentation is to inspire listeners and trigger their imaginations as to how nano-manipulation techniques can be used to solve application problems.
SPEAKER BIO
Gavin Frayne holds a Bachelor of Commerce (Honours) degree from Rhodes University, South Africa. His background is in computer science. He joined Kleindiek Nanotechnik in 2002.
COMPANY INFORMATION
Kleindiek Nanotechnik GmbH
Head office
Aspenhaustrasse 25
72770 Reutlingen, Germany
+49 7121 345 395-0
+49 7121 345 395-55
Email: info@nanotechnik.com
Web: www.nanotechnik.com
Kleindiek Nanotechnik is a leading supplier of nano-manipulation products for electron and light microscopy. Due to miniaturization in semiconductor technology, optics, micro-mechanics, medicine, gene and bio-technology, highly precise positioning techniques are becoming increasingly important. Our products meet and exceed customers’ requirements, offering them a new level of precision as well as exciting new functionality. We are proud to offer our customers 15 years market experience, an installed base of more than 700 systems, complete solutions for many applications and competent and reliable consulting & support worldwide.
