WS/150: Tips, Tricks, and Traps in Ultra-Fast I-V Semiconductor Characterization This seminar, which is a follow-up to the material presented in Keithley’s Fundamentals of Ultra-Fast I-V on-line seminar, is designed to help laboratory engineers implement, troubleshoot, and verify pulsed I-V, transient I-V, and general Ultra-Fast I-V measurement systems. The seminar will provide the keys to getting good measurements. Topics to be discussed include system setup, typical measurement limitations, and results from some actual devices.

Those participating in this seminar will learn:
  • How to properly connect an Ultra-Fast I-V instrument to a probe station
  • Common problems encountered when not properly cabled
  • Tips on performance verification at the probe tips
  • Limitations in Ultra-Fast I-V including Johnson Noise and others
  • Typical examples of Ultra-Fast I-V on sample devices

Target Audience:
This seminar is intended for those whose job requires performing all types of characterization measurements. Students, technicians, engineers, and lab managers who are responsible for installing and maintaining characterization equipment and probe stations will also benefit from this seminar.

About the Presenter
Lee Stauffer is Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group. Prior to joining Keithley, his career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.

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